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- Yuhao ZhangUniversity of Hong KongEmail verificata su hku.hk
- Han WangUniversity of Hong KongEmail verificata su hku.hk
- Lili YuMeta AIEmail verificata su mit.edu
- J. W. ChungSamsung ElectronicsEmail verificata su samsung.com
- Ki Kang KimDepartment of Energy Science, Sungkyunkwan UniversityEmail verificata su skku.edu
- Bin LuEECS, Massachusetts Institute of TechnologyEmail verificata su mit.edu
- Steven DenBaarsProfessor of Materials, University of California Santa BarbaraEmail verificata su engineering.ucsb.edu
- Siddharth RajanElectrical and Computer Engineering, Ohio State UniversityEmail verificata su ece.osu.edu
- Eva MonroyCEA, IRIG, PHELIQS-NPSC, Grenoble, FranceEmail verificata su cea.fr
- Hyung-Seok LeeMassachusetts Institute of TechnologyEmail verificata su etri.re.kr
- Elison MatioliEcole Polytechnique Fédérale de Lausanne (EPFL)Email verificata su epfl.ch
- Alessandro ChiniProfessor of Electronics, University of Modena and Reggio Emilia, ItalyEmail verificata su unimore.it
- Stephen W. KaunApeel SciencesEmail verificata su apeelsciences.com
- Fernando B. NaranjoAssociate Professor at University of AlcaláEmail verificata su depeca.uah.es
- Madhusudan SinghAssociate Professor at Indian Institute of Technology, DelhiEmail verificata su umich.edu