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Igor Beinik
Igor Beinik
Research Engineer, MAX IV, Lund University
Email verificata su maxiv.lu.se
Titolo
Citata da
Citata da
Anno
Enhanced wetting of Cu on ZnO by migration of subsurface oxygen vacancies
I Beinik, M Hellström, TN Jensen, P Broqvist, JV Lauritsen
Nature Communications 6 (1), 8845, 2015
742015
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
I Beinik, M Kratzer, A Wachauer, L Wang, RT Lechner, C Teichert, C Motz, ...
Journal of applied physics 110 (5), 2011
532011
Water Dissociation and Hydroxyl Ordering on Anatase
I Beinik, A Bruix, Z Li, KC Adamsen, S Koust, B Hammer, S Wendt, ...
Physical review letters 121 (20), 206003, 2018
442018
Single-layer MoS 2 formation by sulfidation of molybdenum oxides in different oxidation states on Au (111)
N Salazar, I Beinik, JV Lauritsen
Physical Chemistry Chemical Physics 19 (21), 14020-14029, 2017
412017
Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM
I Beinik, M Kratzer, A Wachauer, L Wang, YP Piryatinski, G Brauer, ...
Beilstein journal of nanotechnology 4 (1), 208-217, 2013
342013
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
B Galiana, I Rey-Stolle, I Beinik, C Algora, C Teichert, ...
Solar energy materials and solar cells 95 (7), 1949-1954, 2011
312011
Conductive atomic-force microscopy investigation of nanostructures in microelectronics
C Teichert, I Beinik
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 691-721, 2010
282010
Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films
JD Pedarnig, K Siraj, MA Bodea, I Puica, W Lang, R Kolarova, P Bauer, ...
Thin Solid Films 518 (23), 7075-7080, 2010
272010
Subsurface hydrogen bonds at the polar Zn-terminated ZnO (0001) surface
M Hellström, I Beinik, P Broqvist, JV Lauritsen, K Hermansson
Physical Review B 94 (24), 245433, 2016
252016
Scanning probe microscopy in nanoscience and nanotechnology
C Teichert, I Beinik, B Bhushan
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 691-721, 2011
232011
Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
P Tejedor, L Díez-Merino, I Beinik, C Teichert
Applied physics letters 95 (12), 2009
202009
Ion beam irradiation of cuprate high-temperature superconductors: Systematic modification of the electrical properties and fabrication of nanopatterns
W Lang, M Marksteiner, MA Bodea, K Siraj, JD Pedarnig, R Kolarova, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
192012
Coverage-dependent oxidation and reduction of vanadium supported on anatase TiO2 (1 0 1)
S Koust, BN Reinecke, KC Adamsen, I Beinik, K Handrup, Z Li, PG Moses, ...
Journal of Catalysis 360, 118-126, 2018
182018
Facile embedding of single vanadium atoms at the anatase TiO 2 (101) surface
S Koust, L Arnarson, PG Moses, Z Li, I Beinik, JV Lauritsen, S Wendt
Physical Chemistry Chemical Physics 19 (14), 9424-9431, 2017
162017
Soft/MAX-A new Soft X-ray Microscopy and Coherent Imaging Beamline at the MAX IV Facility.
J Schwenke, K Thanell, I Beinik, L Roslund, T Tyliszczak
Microscopy and Microanalysis 24 (S2), 232-233, 2018
142018
Step edge structures on the anatase TiO 2 (001) surface studied by atomic-resolution TEM and STM
M Ek, I Beinik, A Bruix, S Wendt, JV Lauritsen, S Helveg
Faraday discussions 208, 325-338, 2018
142018
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
G Brauer, W Anwand, D Grambole, W Egger, P Sperr, I Beinik, L Wang, ...
physica status solidi c 6 (11), 2556-2560, 2009
132009
Electrical and photovoltaic properties of self-assembled Ge nanodomes on Si (001)
M Kratzer, M Rubezhanska, C Prehal, I Beinik, SV Kondratenko, ...
Physical Review B—Condensed Matter and Materials Physics 86 (24), 245320, 2012
122012
KCl ultra-thin films with polar and non-polar surfaces grown on Si (111) 7× 7
I Beinik, C Barth, M Hanbücken, L Masson
Scientific Reports 5 (1), 8223, 2015
112015
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
I Beinik, B Galiana, M Kratzer, C Teichert, I Rey-Stolle, C Algora, ...
Journal of Vacuum Science & Technology B 28 (4), C5G5-C5G10, 2010
112010
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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