| Effects of thickness variation on properties of ZnO thin films grown by pulsed laser deposition JM Myoung, WHY Lee, I Yun, SHB Lee Japanese Journal of Applied Physics 41 (1R), 28, 2002 | 197 | 2002 |
| Effect of carrier concentration on optical bandgap shift in ZnO: Ga thin films CE Kim, P Moon, S Kim, JM Myoung, HW Jang, J Bang, I Yun Thin Solid Films 518 (22), 6304-6307, 2010 | 194 | 2010 |
| Fabrication of rough Al doped ZnO films deposited by low pressure chemical vapor deposition for high efficiency thin film solar cells D Kim, I Yun, H Kim Current Applied Physics 10 (3), S459-S462, 2010 | 177 | 2010 |
| Analysis of bias stress instability in amorphous InGaZnO thin-film transistors EN Cho, JH Kang, CE Kim, P Moon, I Yun IEEE Transactions on Device and Materials Reliability 11 (1), 112-117, 2010 | 125 | 2010 |
| Formation of p-type ZnO film on InP substrate by phosphor doping KH Bang, DK Hwang, MC Park, YD Ko, I Yun, JM Myoung Applied Surface Science 210 (3-4), 177-182, 2003 | 111 | 2003 |
| Annealing effect on the structural and optical properties of ZnO thin film on InP ES Shim, HS Kang, SS Pang, JS Kang, I Yun, SY Lee Materials Science and Engineering: B 102 (1-3), 366-369, 2003 | 103 | 2003 |
| Characteristics and processing effects of ZrO2 thin films grown by metal-organic molecular beam epitaxy MS Kim, YD Ko, JH Hong, MC Jeong, JM Myoung, I Yun Applied surface science 227 (1-4), 387-398, 2004 | 75 | 2004 |
| Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors EN Cho, JH Kang, I Yun Microelectronics Reliability 51 (9-11), 1792-1795, 2011 | 61 | 2011 |
| Characterization and process effects of HfO2 thin films grown by metal-organic molecular beam epitaxy MS Kim, YD Ko, M Yun, JH Hong, MC Jeong, JM Myoung, I Yun Materials Science and Engineering: B 123 (1), 20-30, 2005 | 61 | 2005 |
| Mobility enhancement in amorphous InGaZnO thin-film transistors by Ar plasma treatment JH Kang, E Namkyu Cho, C Eun Kim, MJ Lee, S Jeong Lee, JM Myoung, ... Applied Physics Letters 102 (22), 2013 | 57 | 2013 |
| Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms YD Ko, P Moon, CE Kim, MH Ham, JM Myoung, I Yun Expert Systems with Applications 36 (2), 4061-4066, 2009 | 56 | 2009 |
| Contact resistance dependent scaling-down behavior of amorphous InGaZnO thin-film transistors EN Cho, JH Kang, I Yun Current Applied Physics 11 (4), 1015-1019, 2011 | 54 | 2011 |
| Density-of-states modeling of solution-processed InGaZnO thin-film transistors CE Kim, EN Cho, P Moon, GH Kim, DL Kim, HJ Kim, I Yun IEEE Electron Device Letters 31 (10), 1131-1133, 2010 | 48 | 2010 |
| Growth and characterization of MOMBE grown HfO2 TH Moon, MH Ham, MS Kim, I Yun, JM Myoung Applied surface science 240 (1-4), 105-111, 2005 | 40 | 2005 |
| Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications CE Kim, P Moon, I Yun, S Kim, JM Myoung, HW Jang, J Bang Expert Systems with Applications 38 (3), 2823-2827, 2011 | 35 | 2011 |
| The effect of a deep virtual guard ring on the device characteristics of silicon single photon avalanche diodes D Shin, B Park, Y Chae, I Yun IEEE Transactions on Electron Devices 66 (7), 2986-2991, 2019 | 34 | 2019 |
| Effects of nitrogen doping on device characteristics of InSnO thin film transistor C Eun Kim, I Yun Applied Physics Letters 100 (1), 2012 | 34 | 2012 |
| Zinc diffusion process investigation of InP-based test structures for high-speed avalanche photodiode fabrication I Yun, KS Hyun Microelectronics journal 31 (8), 635-639, 2000 | 31 | 2000 |
| Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm EN Cho, P Moon, CE Kim, I Yun Expert Systems with Applications 39 (10), 8885-8889, 2012 | 28 | 2012 |
| Effects of the interfacial layer on electrical characteristics of Al2O3/TiO2/Al2O3 thin films for gate dielectrics CE Kim, I Yun Applied surface science 258 (7), 3089-3093, 2012 | 28 | 2012 |
Edward Namkyu ChoSamsung ElectronicsEmail verificata su samsung.com
