Ageing and failure modes of IGBT modules in high-temperature power cycling V Smet, F Forest, JJ Huselstein, F Richardeau, Z Khatir, S Lefebvre, ...
IEEE transactions on industrial electronics 58 (10), 4931-4941, 2011
696 2011 Survey on fault operation on multilevel inverters P Lezana, J Pou, TA Meynard, J Rodriguez, S Ceballos, F Richardeau
IEEE Transactions on Industrial Electronics 57 (7), 2207-2218, 2009
477 2009 Architecture complexity and energy efficiency of small wind turbines A Mirecki, X Roboam, F Richardeau
IEEE Transactions on Industrial Electronics 54 (1), 660-670, 2007
320 2007 Multicell converters: Derived topologies TA Meynard, H Foch, F Forest, C Turpin, F Richardeau, L Delmas, ...
IEEE transactions on Industrial Electronics 49 (5), 978-987, 2002
299 2002 Evaluation of Monitoring as a Real-Time Method to Estimate Aging of Bond Wire-IGBT Modules Stressed by Power Cycling V Smet, F Forest, JJ Huselstein, A Rashed, F Richardeau
IEEE Transactions on Industrial Electronics 60 (7), 2760-2770, 2012
259 2012 Reliability calculation of multilevel converters: Theory and applications F Richardeau, TTL Pham
IEEE Transactions on Industrial Electronics 60 (10), 4225-4233, 2012
239 2012 Failures-tolerance and remedial strategies of a PWM multicell inverter F Richardeau, P Baudesson, TA Meynard
IEEE Transactions on power electronics 17 (6), 905-912, 2002
168 2002 Fault management of multicell converters C Turpin, P Baudesson, F Richardeau, F Forest, TA Meynard
IEEE Transactions on Industrial Electronics 49 (5), 988-997, 2002
159 2002 Use of opposition method in the test of high-power electronic converters F Forest, JJ Huselstein, S Faucher, M Elghazouani, P Ladoux, ...
IEEE Transactions on Industrial Electronics 53 (2), 530-541, 2006
141 2006 Comparative study of maximum power strategy in wind turbines A Mirecki, X Roboam, F Richardeau
2004 IEEE International Symposium on Industrial Electronics 2, 993-998, 2004
93 2004 Versatile three-level FC-NPC converter with high fault-tolerance capabilities: Switch fault detection and isolation and safe postfault operation ABB Abdelghani, HB Abdelghani, F Richardeau, JM Blaquière, F Mosser, ...
IEEE Transactions on Industrial Electronics 64 (8), 6453-6464, 2017
44 2017 Physical origin of the gate current surge during short-circuit operation of SiC MOSFET F Boige, D Trémouilles, F Richardeau
IEEE Electron Device Letters 40 (5), 666-669, 2019
39 2019 A ZVS imbricated cell multilevel inverter with auxiliary resonant commutated poles C Turpin, L Deprez, F Forest, F Richardeau, TA Meynard
IEEE Transactions on Power Electronics 17 (6), 874-882, 2002
39 2002 CMOS Active Gate Driver for Closed-Loop dv /dt Control of GaN Transistors P Bau, M Cousineau, B Cougo, F Richardeau, N Rouger
IEEE Transactions on Power Electronics 35 (12), 13322-13332, 2020
38 2020 Redundancy structures for static converters JJ Huselstein, E Sarraute, F Richardeau, T Martire
US Patent 9,184,585, 2015
38 2015 Using the multilevel imbricated cells topologies in the design of low-power power-factor-corrector converters F Forest, TA Meynard, S Faucher, F Richardeau, JJ Huselstein, C Joubert
IEEE Transactions on Industrial Electronics 52 (1), 151-161, 2005
38 2005 Investigation on damaged planar-oxide of 1200 V SiC power MOSFETs in non-destructive short-circuit operation F Boige, F Richardeau, D Trémouilles, S Lefebvre, G Guibaud
Microelectronics Reliability 76, 500-506, 2017
37 2017 Ensure an original and safe “fail-to-open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation F Boige, F Richardeau, S Lefebvre, JM Blaquière, G Guibaud, ...
Microelectronics Reliability 88, 598-603, 2018
36 2018 Method and device for supply to a magnetic coupler TA Meynard, F Forest, F Richardeau, E Laboure
US Patent 7,847,535, 2010
32 2010 Gate leakage-current analysis and modelling of planar and trench power SiC MOSFET devices in extreme short-circuit operation F Boige, F Richardeau
Microelectronics Reliability 76, 532-538, 2017
31 2017