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- Luke R WilsonSheffieldEmail verificata su sheffield.ac.uk
- Dmitry RevinThe University of SheffieldEmail verificata su sheffield.ac.uk
- JPR DavidUniversity of SheffieldEmail verificata su sheffield.ac.uk
- M S SkolnickProfessor of Physics, University of SheffieldEmail verificata su sheffield.ac.uk
- Andrew ShieldsToshiba Europe LtdEmail verificata su crl.toshiba.co.uk
- Alexander TartakovskiiProfessor of Solid State Physics, University of SheffieldEmail verificata su sheffield.ac.uk
- Jan HuwerSenior Research Scientist, Toshiba Europe LtdEmail verificata su crl.toshiba.co.uk
- Jo Shien NgProfessor of Semiconductor Devices, University of SheffieldEmail verificata su sheffield.ac.uk
- Evgeny ChekhovichSenior Lecturer at the University of Sussex, UKEmail verificata su sussex.ac.uk
- R Mark StevensonToshiba Europe LimitedEmail verificata su crl.toshiba.co.uk
- David A RitchieUniversity of Cambridge and Swansea UniversityEmail verificata su cam.ac.uk
- Kenneth KennedyKing Abdullah University of Science and TechnologyEmail verificata su kaust.edu.sa
- Tina MüllerToshiba Research Europe LtdEmail verificata su crl.toshiba.co.uk
- Gottfried StrasserProfessor Materials Engineering for Nanoelectronics, TU WienEmail verificata su tuwien.ac.at
- Mark HopkinsonUniversity of SheffieldEmail verificata su sheffield.ac.uk
- Grammatiki LioliouUniversity College LondonEmail verificata su ucl.ac.uk
- SILVIA BUTERAUniversity of SussexEmail verificata su sussex.ac.uk
- Robert J AireyResearch Associate in Electronic EngineeringEmail verificata su sheffield.ac.uk
- Alwyn SeedsUniversity College LondonEmail verificata su ucl.ac.uk
- Chee Hing TanThe University Of SheffieldEmail verificata su sheffield.ac.uk