| Two-dimensional x-ray beam phase sensing S Bérujon, E Ziegler, R Cerbino, L Peverini Physical review letters 108 (15), 158102, 2012 | 208 | 2012 |
| X-ray-scattering information obtained from near-field speckle R Cerbino, L Peverini, MAC Potenza, A Robert, P Bösecke, M Giglio Nature Physics 4 (3), 238-243, 2008 | 136 | 2008 |
| Development of a self-consistent free-form approach for studying the three-dimensional morphology of a thin film IV Kozhevnikov, L Peverini, E Ziegler Physical Review B—Condensed Matter and Materials Physics 85 (12), 125439, 2012 | 71 | 2012 |
| Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines SG Alcock, I Nistea, JP Sutter, K Sawhney, JJ Fermé, C Thellièr, ... Journal of Synchrotron Radiation 22 (1), 10-15, 2015 | 47 | 2015 |
| Roughness conformity during tungsten film growth: An in situ synchrotron x-ray scattering study L Peverini, E Ziegler, T Bigault, I Kozhevnikov Physical Review B—Condensed Matter and Materials Physics 72 (4), 045445, 2005 | 40 | 2005 |
| The ESRF BM05 metrology beamline: Instrumentation and performance upgrade E Ziegler, J Hoszowska, T Bigault, L Peverini, JY Massonnat, R Hustache AIP Conference Proceedings 705 (1), 436-439, 2004 | 38 | 2004 |
| Ion beam profiling of aspherical X-ray mirrors L Peverini, IV Kozhevnikov, A Rommeveaux, PV Vaerenbergh, L Claustre, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 35 | 2010 |
| Polycrystalline Ni thin films on nanopatterned Si substrates: From highly conformal to nonconformal anisotropic growth A Keller, L Peverini, J Grenzer, GJ Kovacs, A Mücklich, S Facsko Physical Review B—Condensed Matter and Materials Physics 84 (3), 035423, 2011 | 31 | 2011 |
| Dynamic scaling of roughness at the early stage of tungsten film growth L Peverini, E Ziegler, T Bigault, I Kozhevnikov Physical Review B—Condensed Matter and Materials Physics 76 (4), 045411, 2007 | 31 | 2007 |
| Asymmetric grazing incidence small angle x-ray scattering and anisotropic domain wall motion in obliquely grown nanocrystalline Co films C Quirós, L Peverini, J Díaz, A Alija, C Blanco, M Vélez, O Robach, ... Nanotechnology 25 (33), 335704, 2014 | 27 | 2014 |
| Evolution of surface roughness in silicon X-ray mirrors exposed to a low-energy ion beam E Ziegler, L Peverini, N Vaxelaire, A Cordon-Rodriguez, A Rommeveaux, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 27 | 2010 |
| Development of soft and hard X-ray optics for astronomy O Citterio, P Conconi, M Ghigo, F Mazzoleni, G Pareschi, L Peverini X-Ray Optics, Instruments, and Missions IV 4138, 43-56, 2000 | 24 | 2000 |
| On‐Line Mirror Surfacing Monitored by X‐ray Shearing Interferometry and X‐ray Scattering E Ziegler, L Peverini, IV Kozhevnikov, T Weitkamp, C David AIP Conference Proceedings 879 (1), 778-781, 2007 | 19 | 2007 |
| Exact solution of the phase problem in in situ x-ray reflectometry of a growing layered film I Kozhevnikov, L Peverini, E Ziegler Journal of applied physics 104 (5), 2008 | 18 | 2008 |
| Evolution of surface morphology at the early stage of Al2O3 film growth on a rough substrate EO Filatova, L Peverini, E Ziegler, IV Kozhevnikov, P Jonnard, JM Andre Journal of Physics: Condensed Matter 22 (34), 345003, 2010 | 16 | 2010 |
| Roughness evolution of Si surfaces upon Ar ion erosion V de Rooij-Lohmann, IV Kozhevnikov, L Peverini, E Ziegler, R Cuerno, ... Applied surface science 256 (16), 5011-5014, 2010 | 16 | 2010 |
| Exact determination of the phase in time-resolved X-ray reflectometry I Kozhevnikov, L Peverini, E Ziegler Optics express 16 (1), 144-149, 2008 | 16 | 2008 |
| Bö secke, P. & Giglio, M.(2008) R Cerbino, L Peverini, MAC Potenza, A Robert Nat. Phys 4, 238-243, 0 | 14 | |
| X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions C Ferrari, F Germini, D Korytár, P Mikulík, L Peverini Journal of Applied Crystallography 44 (2), 353-358, 2011 | 13 | 2011 |
| Dynamic scaling in ion etching of tungsten films L Peverini, E Ziegler, I Kozhevnikov Applied Physics Letters 91 (5), 2007 | 13 | 2007 |
