| Simulation of DIBL effect in 25 nm SOI-FinFET with the different body shapes AE Atamuratov, A Abdikarimov, M Khalilloev, ZA Atamuratova, ... Наносистемы: физика, химия, математика 8 (1), 71-74, 2017 | 11 | 2017 |
| Characterising lateral capacitance of MNOSFET with localised trapped charge in nitride layer AE Atamuratov, ZA Atamuratova, A Yusupov, A Ghani Results in Physics 11, 656-658, 2018 | 7 | 2018 |
| Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection AE Atamuratov, A Yusupov, ZA Atamuratova, JC Chedjou, K Kyamakya Applied Sciences 10 (21), 7935, 2020 | 6 | 2020 |
| The lateral capacitance of nanometer mnosfet with a single charge trapped in oxide layeror at SiO2-Si3N4 interfaceat E Atamuratov, UA Aminov, ZA Atamuratova, M Halillaev, A Abdikarimov, ... Наносистемы: физика, химия, математика 6 (6), 837-842, 2015 | 5 | 2015 |
| Anomalous Behavior of Lateral C–V Characteristic of an MNOS Transistor with an Embedded Local Charge in the Nitride Layer ZA Atamuratova, A Yusupov, BO Khalikberdiev, AE Atamuratov Technical Physics 64, 1006-1009, 2019 | 4 | 2019 |
| Simulation of DIBL effect in junctionless SOI MOSFETs with extended gate AE Atamuratov, M Khalilloev, A Abdikarimov, ZA Atamuratova, M Kittler, ... Наносистемы: физика, химия, математика 8 (1), 75-78, 2017 | 1 | 2017 |
| Capacitance Method for Identifying Degradation due to Electrical Stress in MOSFETs ZA Atamuratova, A Yusupov, JC Chedjou, K Kyamakya e-Journal of Surface Science and Nanotechnology 20 (4), 202-206, 2022 | | 2022 |
| New fast method for reading charge bit stored in MNOSFET AE Atamuratov, ZA Atamuratova, A Yusupov | | 2018 |
| Simulation of random telegraph noise in nanometer nMOSFET induced by interface and oxide trapped charge AE Atamuratov, R Granzner, M Kittler, Z Atamuratova, M Halillaev, ... Low-Dimensional Functional Materials, 243-249, 2013 | | 2013 |
| Simulation of carrier distribution in nanometer nMOSFET with single charge trapped in oxide and at Si-SiO2 -interface AE Atamuratov, Z Atamuratova, M Halillaev, G Ghione | | 2012 |
