| Design of an instrument for measuring the spectral bidirectional scatter distribution function FB Leloup, S Forment, P Dutré, MR Pointer, P Hanselaer Applied optics 47 (29), 5454-5467, 2008 | 106 | 2008 |
| Toward the soft metrology of surface gloss: A review FB Leloup, G Obein, MR Pointer, P Hanselaer Color Research & Application 39 (6), 559-570, 2014 | 86 | 2014 |
| Geometry of illumination, luminance contrast, and gloss perception FB Leloup, MR Pointer, P Dutré, P Hanselaer Journal of the Optical Society of America A 27 (9), 2046-2054, 2010 | 56 | 2010 |
| Overall gloss evaluation in the presence<? A3B2 show [pmg: line-break justify=" yes"/]?> of multiple cues to surface glossiness FB Leloup, MR Pointer, P Dutré, P Hanselaer Journal of the Optical Society of America A 29 (6), 1105-1114, 2012 | 36 | 2012 |
| Luminance-based specular gloss characterization FB Leloup, MR Pointer, P Dutré, P Hanselaer Journal of the Optical Society of America A 28 (6), 1322-1330, 2011 | 35 | 2011 |
| Metrological issues related to BRDF measurements around the specular direction in the particular case of glossy surfaces G Obein, J Audenaert, G Ged, FB Leloup Measuring, Modeling, and Reproducing Material Appearance 2015 9398, 95-104, 2015 | 28 | 2015 |
| Determination of the bulk scattering parameters of diffusing materials S Leyre, FB Leloup, J Audenaert, G Durinck, J Hofkens, G Deconinck, ... Applied optics 52 (18), 4083-4090, 2013 | 26 | 2013 |
| Development of an image-based gloss measurement instrument FB Leloup, J Audenaert, P Hanselaer Journal of Coatings Technology and Research 16, 913-921, 2019 | 20 | 2019 |
| " Multidimensional reflectometry for industry"(xD-Reflect) an European research project A Höpe, A Koo, FM Verdú, FB Leloup, G Obein, G Wübbeler, J Campos, ... Measuring, Modeling, and Reproducing Material Appearance 9018, 9-19, 2014 | 18 | 2014 |
| Practical limitations of near-field goniophotometer measurements imposed by a dynamic range mismatch J Audenaert, PC Acuña R, P Hanselaer, FB Leloup Optics Express 23 (3), 2240-2251, 2015 | 17 | 2015 |
| Characterization of gonio-apparent colours F Leloup, P Hanselaer, MR Pointer, J Versluys 10th AIC Congress Granada, 515-518, 2005 | 17 | 2005 |
| Repeatability and reproducibility of specular gloss meters in theory and practice FB Leloup, J Audenaert, G Obein, G Ged, P Hanselaer Journal of coatings technology and research 13 (6), 941-951, 2016 | 16 | 2016 |
| Optical path length enhancement for> 13% screenprinted thin film silicon solar cells F Duerinckx, IK Filipek, K Nieuwenhuysen, G Beaucarne, J Poortmans, ... 21st European Photovoltaic Solar Energy Conference 4 (8), 2006 | 16 | 2006 |
| Simulating the spatial luminance distribution of planar light sources by sampling of ray files J Audenaert, G Durinck, FB Leloup, G Deconinck, P Hanselaer Optics Express 21 (20), 24099-24111, 2013 | 15 | 2013 |
| BRDF and gloss measurements F Leloup, P Hanselaer, SAB Forment CIE Expert Symposium on Visual Appearance, 2007 | 14 | 2007 |
| Multilateral spectral radiance factor scale comparison C Strothkämper, A Ferrero, A Koo, P Jaanson, G Ged, G Obein, S Källberg, ... Applied Optics 56 (7), 1996-2006, 2017 | 12 | 2017 |
| Bayesian deconvolution method applied to experimental bidirectional transmittance distribution functions J Audenaert, FB Leloup, G Durinck, G Deconinck, P Hanselaer Measurement Science and Technology 24 (3), 035202, 2013 | 11 | 2013 |
| Integration of Multiple Cues for Visual Gloss Evaluation FB Leloup, P Hanselaer, MR Pointer, P Dutré Proc. Predicting Perceptions: the 3rd International Conference on Appearance …, 2012 | 11 | 2012 |
| Design of an inexpensive integrating sphere student laboratory setup for the optical characterization of light sources FB Leloup, S Leyre, E Bauwens, T Van den Abeele, P Hanselaer European Journal of Physics 37 (1), 015302, 2015 | 10 | 2015 |
| Impact of the accurateness of bidirectional reflectance distribution function data on the intensity and luminance distributions of a light-emitting diode mixing chamber as … J Audenaert, FB Leloup, B Van Giel, G Durinck, G Deconinck, ... Optical Engineering 52 (9), 095101-095101, 2013 | 10 | 2013 |
