Frequency dependent electrical characteristics of BiFeO3 MOS capacitors S Kaya, R Lok, A Aktag, J Seidel, E Yilmaz
Journal of Alloys and Compounds 583, 476-480, 2014
62 2014 Effects of post deposition annealing, interface states and series resistance on electrical characteristics of HfO2 MOS capacitors A Kahraman, E Yilmaz, S Kaya, A Aktag
Journal of Materials Science: Materials in Electronics 26, 8277-8284, 2015
53 2015 Modifications of structural, chemical, and electrical characteristics of Er2O3/Si interface under Co-60 gamma irradiation S Kaya, E Yilmaz
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2018
51 2018 A Comprehensive Study on the Frequency-Dependent Electrical Characteristics of Sm2 O3 MOS Capacitors S Kaya, E Yilmaz
IEEE Transactions on Electron Devices 62 (3), 980-987, 2015
51 2015 Evaluation of Radiation Sensor Aspects of MOS Capacitors under Zero Gate Bias A Kahraman, E Yilmaz, A Aktag, S Kaya
IEEE Transactions on Nuclear Science 63 (2), 1284-1293, 2016
47 2016 Samarium oxide thin films deposited by reactive sputtering: effects of sputtering power and substrate temperature on microstructure, morphology and electrical properties S Kaya, E Yilmaz, H Karacali, AO Çetinkaya, A Aktag
Materials Science in Semiconductor Processing 33, 42-48, 2015
47 2015 Frequency dependent gamma-ray irradiation response of Sm2O3 MOS capacitors S Kaya, E Yilmaz, A Kahraman, H Karacali
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2015
46 2015 Influences of Co-60 gamma-ray irradiation on electrical characteristics of Al2 O3 MOS capacitors S Kaya, E Yilmaz
Journal of Radioanalytical and Nuclear Chemistry 302, 425-431, 2014
34 2014 A detailed study on the frequency-dependent electrical characteristics of Al/HfSiO4 /p-Si MOS capacitors R Lok, S Kaya, H Karacali, E Yilmaz
Journal of Materials Science: Materials in Electronics 27, 13154-13160, 2016
29 2016 Effects of substrate temperature on the microstructure and morphology of CdZnTe thin films H Malkas, S Kaya, E Yilmaz
Journal of electronic materials 43, 4011-4017, 2014
29 2014 Effects of gamma-ray irradiation on interface states and series-resistance characteristics of BiFeO3 MOS capacitors S Kaya, A Aktag, E Yilmaz
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
29 2014 Structural and electrical characterizations of BiFeO3 capacitors deposited by sol–gel dip coating technique AO Cetinkaya, S Kaya, A Aktag, E Budak, E Yilmaz
Thin Solid Films 590, 7-12, 2015
28 2015 The Co-60 gamma-ray irradiation effects on the Al/HfSiO4/p-Si/Al MOS capacitors R Lok, S Kaya, H Karacali, E Yilmaz
Radiation Physics and Chemistry 141, 155-159, 2017
23 2017 The gamma irradiation responses of yttrium oxide capacitors and first assessment usage in radiation sensors S Abubakar, S Kaya, H Karacali, E Yilmaz
Sensors and Actuators A: Physical 258, 44-48, 2017
23 2017 Co-60 gamma irradiation influences on physical, chemical and electrical characteristics of HfO2/Si thin films S Kaya, I Yıldız, R Lok, E Yılmaz
Radiation Physics and Chemistry 150, 64-70, 2018
22 2018 Use of BiFeO3 layer as a dielectric in MOS based radiation sensors fabricated on a Si substrate S Kaya, E Yilmaz
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
22 2014 Evolutions on surface chemistry, microstructure, morphology and electrical characteristics of SnO2/p-Si heterojuction under various annealing parameters S Kaya
Journal of Alloys and Compounds 778, 889-899, 2019
21 2019 Co-60 gamma irradiation effects on electrical characteristics of HfO2 MOSFETs and specification of basic radiation-induced degradation mechanism S Kaya, A Jaksic, E Yilmaz
Radiation Physics and Chemistry 149, 7-13, 2018
21 2018 A Detailed Study on Zero-Bias Irradiation Responses of MOS Capacitors E Yilmaz, S Kaya
IEEE Transactions on Nuclear Science 63 (2), 1301-1305, 2016
20 2016 Characterization of interface defects in BiFeO3 metal–oxide–semiconductor capacitors deposited by radio frequency magnetron sputtering S Kaya, E Yilmaz, A Aktag, J Seidel
Journal of Materials Science: Materials in Electronics 26, 5987-5993, 2015
20 2015