| SWIR detectors for night vision at AIM H Figgemeier, M Benecke, K Hofmann, R Oelmaier, A Sieck, J Wendler, ... Infrared Technology and Applications XL 9070, 62-72, 2014 | 56 | 2014 |
| Numerical modeling of SRH and tunneling mechanisms in high-operating-temperature MWIR HgCdTe photodetectors M Vallone, M Mandurrino, M Goano, F Bertazzi, G Ghione, W Schirmacher, ... Journal of Electronic Materials 44, 3056-3063, 2015 | 48 | 2015 |
| Progress of MCT detector technology at AIM towards smaller pitch and lower dark current D Eich, W Schirmacher, S Hanna, KM Mahlein, P Fries, H Figgemeier Journal of Electronic Materials 46, 5448-5457, 2017 | 36 | 2017 |
| Impact of critical processes on HgCdTe diode performance and yield H Figgemeier, M Bruder, KM Mahlein, R Wollrab, J Ziegler Journal of electronic materials 32, 588-591, 2003 | 33 | 2003 |
| Improved high operating temperature MCT MWIR modules H Lutz, R Breiter, H Figgemeier, T Schallenberg, W Schirmacher, ... Infrared Technology and Applications XL 9070, 395-406, 2014 | 31 | 2014 |
| Simulation of small-pitch HgCdTe photodetectors M Vallone, M Goano, F Bertazzi, G Ghione, W Schirmacher, S Hanna, ... Journal of Electronic Materials 46, 5458-5470, 2017 | 24 | 2017 |
| MCT-based LWIR and VLWIR 2D focal plane detector arrays for low dark current applications at AIM S Hanna, D Eich, KM Mahlein, W Fick, W Schirmacher, R Thöt, J Wendler, ... Journal of Electronic Materials 45 (9), 4542-4551, 2016 | 24 | 2016 |
| Comparing FDTD and ray-tracing models in numerical simulation of HgCdTe LWIR photodetectors M Vallone, M Goano, F Bertazzi, G Ghione, W Schirmacher, S Hanna, ... Journal of Electronic Materials 45, 4524-4531, 2016 | 23 | 2016 |
| Diffusive-probabilistic model for inter-pixel crosstalk in HgCdTe focal plane arrays M Vallone, M Goano, F Bertazzi, G Ghione, S Hanna, D Eich, ... IEEE Journal of the Electron Devices Society 6, 664-673, 2018 | 22 | 2018 |
| Small pixel pitch MCT IR-modules H Lutz, R Breiter, D Eich, H Figgemeier, P Fries, S Rutzinger, J Wendler Infrared Technology and Applications XLII 9819, 518-535, 2016 | 20 | 2016 |
| MCT SWIR modules for passive and active imaging applications R Breiter, M Benecke, D Eich, H Figgemeier, A Weber, J Wendler, A Sieck Infrared Technology and Applications XLII 9819, 46-55, 2016 | 20 | 2016 |
| Improvements of MCT MBE growth on GaAs J Ziegler, J Wenisch, R Breiter, D Eich, H Figgemeier, P Fries, H Lutz, ... Journal of electronic materials 43, 2935-2940, 2014 | 20 | 2014 |
| Improved MCT LWIR modules for demanding imaging applications R Breiter, H Figgemeier, H Lutz, J Wendler, S Rutzinger, T Schallenberg Infrared Technology and Applications XLI 9451, 604-614, 2015 | 19 | 2015 |
| Reducing inter-pixel crosstalk in HgCdTe detectors M Vallone, M Goano, F Bertazzi, G Ghione, A Palmieri, S Hanna, D Eich, ... Optical and Quantum Electronics 52 (1), 25, 2020 | 17 | 2020 |
| Cd1− yZnyTe substrates for Hg1− xCdxTe liquid-phase epitaxy M Bruder, H Figgemeier, R Schmitt, H Maier Materials Science and Engineering: B 16 (1-3), 40-43, 1993 | 17 | 1993 |
| Towards ultra-small pixel pitch cooled MW and LW IR-modules H Lutz, R Breiter, D Eich, H Figgemeier, S Hanna, R Oelmaier, J Wendler Infrared Technology and Applications XLIV 10624, 68-83, 2018 | 14 | 2018 |
| Evaluation of HgCdTe on GaAs grown by molecular beam epitaxy for high-operating-temperature infrared detector applications J Wenisch, W Schirmacher, R Wollrab, D Eich, S Hanna, R Breiter, H Lutz, ... Journal of Electronic Materials 44 (9), 3002-3006, 2015 | 14 | 2015 |
| Constraints and performance trade-offs in Auger-suppressed HgCdTe focal plane arrays M Vallone, M Goano, F Bertazzi, G Ghione, S Hanna, D Eich, A Sieck, ... Applied Optics 59 (17), E1-E8, 2020 | 13 | 2020 |
| Improved high performance MCT MWIR and LWIR modules H Lutz, R Breiter, D Eich, H Figgemeier, S Hanna Infrared Technology and Applications XLV 11002, 249-261, 2019 | 13 | 2019 |
| Short-wave infrared HgCdTe electron avalanche photodiodes for gated viewing A Sieck, M Benecke, D Eich, R Oelmaier, J Wendler, H Figgemeier Journal of Electronic Materials 47 (10), 5705-5714, 2018 | 13 | 2018 |
