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Tino Hofmann
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Anisotropy, phonon modes, and free charge carrier parameters in monoclinic -gallium oxide single crystals
M Schubert, R Korlacki, S Knight, T Hofmann, S Schöche, V Darakchieva, ...
Physical Review B 93 (12), 125209, 2016
2172016
Ellipsometry at the Nanoscale
M Losurdo, K Hingerl
Springer, 2013
2152013
Ellipsometry of functional organic surfaces and films
K Hinrichs, KJ Eichhorn
Springer, 2018
1572018
Transient Absorption Measurements on Anisotropic Monolayer ReS2
Q Cui, J He, MZ Bellus, M Mirzokarimov, T Hofmann, HY Chiu, M Antonik, ...
Small 11 (41), 5565-5571, 2015
1172015
Protein adsorption on and swelling of polyelectrolyte brushes: A simultaneous ellipsometry-quartz crystal microbalance study
E Bittrich, KB Rodenhausen, KJ Eichhorn, T Hofmann, M Schubert, ...
Biointerphases 5, 159, 2010
1142010
Variable-wavelength frequency-domain terahertz ellipsometry
T Hofmann, CM Herzinger, A Boosalis, TE Tiwald, JA Woollam, ...
Review of Scientific Instruments 81, 023101, 2010
1142010
Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in …
M Schubert, T Hofmann, CM Herzinger
JOSA A 20 (2), 347-356, 2003
1112003
Optical, structural, and magnetic properties of cobalt nanostructure thin films
D Schmidt, AC Kjerstad, T Hofmann, R Skomski, E Schubert, M Schubert
Journal of Applied Physics 105 (11), 113508-113508-7, 2009
962009
Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry
D Schmidt, B Booso, T Hofmann, E Schubert, A Sarangan, M Schubert
Applied Physics Letters 94, 011914, 2009
942009
Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films
D Schmidt, B Booso, T Hofmann, E Schubert, A Sarangan, M Schubert
Optics letters 34 (7), 992-994, 2009
852009
Terahertz magneto-optic generalized ellipsometry using synchrotron and blackbody radiation
T Hofmann, U Schade, CM Herzinger, P Esquinazi, M Schubert
Review of scientific instruments 77, 063902, 2006
762006
Invited Article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument
P Kühne, CM Herzinger, M Schubert, JA Woollam, T Hofmann
Review of Scientific Instruments 85 (7), 2014
672014
Infrared dielectric response of nanoscribe IP-dip and IP-L monomers after polymerization from 250 cm−1 to 6000 cm−1
DB Fullager, GD Boreman, T Hofmann
Optical Materials Express 7 (3), 888-894, 2017
662017
Terahertz ellipsometry and terahertz optical-Hall effect
T Hofmann, CM Herzinger, JL Tedesco, DK Gaskill, JA Woollam, ...
Thin Solid Films 519 (9), 2593-2600, 2011
662011
Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films
MF Saenger, T Höing, BW Robertson, RB Billa, T Hofmann, E Schubert, ...
Physical Review B—Condensed Matter and Materials Physics 78 (24), 245205, 2008
662008
Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures
T Hofmann, P Kühne, S Schöche, T Chen Jr, U Forsberg, E Janzén, ...
Applied Physics Letters 101 (19), 2012
642012
Resistive hysteresis and interface charge coupling in BaTiO-ZnO heterostructures
VM Voora, T Hofmann, M Brandt, M Lorenz, M Grundmann, N Ashkenov, ...
Applied Physics Letters 94, 142904, 2009
632009
Optical Hall effect—model description: tutorial
M Schubert, P Kühne, V Darakchieva, T Hofmann
JOSA A 33 (8), 1553-1568, 2016
612016
Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit
KB Rodenhausen, T Kasputis, AK Pannier, JY Gerasimov, RY Lai, ...
Review of Scientific Instruments 82, 103111, 2011
552011
Infrared dielectric anisotropy and phonon modes of rutile TiO2
S Schöche, T Hofmann, R Korlacki, TE Tiwald, M Schubert
Journal of Applied Physics 113 (16), 2013
542013
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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