Profili

Mark Biesinger

Surface Science Western, University of Western Ontario

Email verificata su uwo.ca

Citato da 27107

Surface Science Surface Analysis X-ray Photoelectron Spectroscopy XPS ToF-SIMS

Joseph Halim

IFM dept., Linköping University, Sweden

Email verificata su liu.se

Citato da 18716

XPS MAX/MXene Two dimensional Materials Thin Films Electronic properties

Kateryna Artyushkova

President , Physical Electronics, Inc

Email verificata su phi.com

Citato da 18288

surface analysis XPS multivariate analysis microscopy digital image processing

Michael Haevecker

staff scientist PhD, MPI for Chemical Energy Conversion / BESSY II

Email verificata su fhi-berlin.mpg.de

Citato da 16156

ambient pressure electron spectroscopy catalysis XAS XPS

Grzegorz (Greg) Greczynski

Linköping University

Email verificata su liu.se

Citato da 14205

XPS HiPIMS materials science thin films ion mass spectrometry

Sven Tougaard

Professor of physics, University of Southern Denmark

Email verificata su sdu.dk

Citato da 12197

solid state nanostructures XPS

V. Shutthanandan

EMSL, Pacific Northwest National Lab

Email verificata su pnnl.gov

Citato da 12189

Material Science Physics XPS helium ion microscope RBS

Fei Gao

Nanjing University of Information Science and Technology

Email verificata su nuist.edu.cn

Citato da 11436

Environmental catalysis Rare earth catalysis deNOx XPS

Stephen McDonnell

University of Virginia

Email verificata su virginia.edu

Citato da 11332

Material Science Thin Films Semiconductors XPS MBE

Lena Trotochaud

Senior Staff Characterization Engineer, Twelve

Email verificata su twelve.co

Citato da 9908

Electrocatalysis XPS Analytical Chemistry Layered-Double Hydroxides Failure Analysis

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