Christoforos THEODOROU

Christoforos THEODOROU

IMEP-LAHC, Minatec, Grenoble INP
Email verificata su minatec.inpg.fr
Citato da 1186
Device characterization Low-frequency noise Random Telegraph Noise
Mahfuzul Islam

Mahfuzul Islam

Institute of Science Tokyo
Email verificata su m.isct.ac.jp
Citato da 676
Variability Modeling Random Telegraph Noise Temperature Sensor Digital LDO Flash ADC
Maurício Banaszeski da Silva

Maurício Banaszeski da Silva

UFRGS
Email verificata su inf.ufrgs.br
Citato da 128
Random Telegraph Noise Low Frequency Noise Aging Effects Reliability of Integrated Circuits Device Modeling and Characteriza
Jereme Neuendank

Jereme Neuendank

Graduate Research Associate, Arizona State University
Email verificata su asu.edu
Citato da 22
radiation effects radiation hardened microelectronics random telegraph noise random telegraph