Youngbin Lee

Youngbin Lee

Korea Electronics Technology Institute
Email verificata su keti.re.kr
Citato da 17473
Semiconductor reliability Device characterization Nanomaterials
Behrang H. Hamadani

Behrang H. Hamadani

National Institute of Standards and Technology
Email verificata su nist.gov
Citato da 3826
photovoltaics wide bandgap materials device characterization physics defects in semiconductors
Abby R. Whittington

Abby R. Whittington

Virginia Tech
Email verificata su vt.edu
Citato da 3341
Medical Devices Device Characterization Biobased Materials Degradable Polymers
Dominique Planson

Dominique Planson

Professeur des Universités, INSA de Lyon
Email verificata su insa-lyon.fr
Citato da 2894
Wide Bandgap Semiconductor Device Characterization Device Design Silicon Carbide Gallium Nitride
Chih-Hung Chen

Chih-Hung Chen

Professor, Dept. Electrical & Computer Engineering, McMaster University
Email verificata su mcmaster.ca
Citato da 2891
Noise Modeling MOSFETs Low Noise Circuits Device Characterization
Xiaoye Qin

Xiaoye Qin

Intel
Citato da 2773
GaN HEMTs XPS Device Characterization
Erik Johnson

Erik Johnson

LPICM CNRS Ecole Polytechnique
Email verificata su polytechnique.edu
Citato da 2191
Photovoltaics plasma processing optoelectronics device characterization RF engineering
Kwan H. Lee

Kwan H. Lee

UQ Postdoctoral Research Fellow, University of Queensland
Email verificata su physics.uq.edu.au
Citato da 2076
Organic Electronics Organic Solar Cells Device Fabrication Device Characterization Ultrafast Spectroscopy
Michael E Ramon

Michael E Ramon

The University of Texas at Austin
Email verificata su utexas.edu
Citato da 1394
Nanoelectronics Nanofabrication Device Characterization
Dr. Yun Seop Yu

Dr. Yun Seop Yu

Hankyong National University
Email verificata su hknu.ac.kr
Citato da 1340
Device modeling for circuit simulation Device characterization
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