Janusz Rajski

Janusz Rajski

Vice President of Engineering, Siemens
Email verificata su mentor.com
Citato da 16363
Electronic Design Automation VLSI Testing Design For Test
Bashir M. Al-Hashimi

Bashir M. Al-Hashimi

Professor of Computer Engineering, King's College London
Email verificata su kcl.ac.uk
Citato da 11589
Energy-efficient computing embedded systems design for test
Mehdi B. Tahoori

Mehdi B. Tahoori

Professor of Computer Science, Karlsruhe Institute of Technology, Germany
Email verificata su kit.edu
Citato da 11073
reliable computing printed electronics electronic design automation design for test emerging technologies
Wu-Tung Cheng

Wu-Tung Cheng

chief scientist, mentor graphics
Email verificata su mentor.com
Citato da 6540
design for test
Nilanjan Mukherjee

Nilanjan Mukherjee

Senior Engineering Director, Siemens Digital Industries Software
Email verificata su mentor.com
Citato da 6145
Design-for-Test Memory Testing ATPG Fault simulation Compression
Tim Cowles

Tim Cowles

TIE - Texas Institute For Electronics
Email verificata su austin.utexas.edu
Citato da 2462
DRAM & Emerging Memory Semiconductors Design For Test Cloud
Erik Larsson

Erik Larsson

Lunds Universitet
Email verificata su eit.lth.se
Citato da 2154
Design for test test fault tolerance
Érika Cota

Érika Cota

Universidade Federal do Rio Grande do Sul
Email verificata su inf.ufrgs.br
Citato da 1997
test of embedded systems software test hardware test design for test
Naghmeh Karimi

Naghmeh Karimi

Associate Professor, Computer Science & Electrical Eng., University of Maryland Baltimore …
Email verificata su umbc.edu
Citato da 1653
Hardware Security & Reliability Design-for-Security Design-for-Reliability Design-for-Test VLSI
Juergen Schloeffel

Juergen Schloeffel

Mentor, a Siemens Business
Citato da 1324
Nano Electronics Design for Test
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