Yogesh S. Chauhan

Yogesh S. Chauhan

Fellow IEEE, FNAE, Professor-IIT Kanpur
Email verificata su iitk.ac.in
Citato da 7330
ASM GaN HEMT Compact Model BSIM SPICE Model Cryogenic Transistor Modeling Ferroelectric Negative Capacitance Transistor
Md Abdul Wahab

Md Abdul Wahab

Intel, Hillsboro, Oregon, Purdue University
Email verificata su intel.com
Citato da 694
Compact Model Device Physics Variability and Reliability Array of Nanotubes/Nanowires 2D Nanomaterials
Chhandak Mukherjee

Chhandak Mukherjee

Chargé de Rechereche CNRS, IMS Laboratory, University of Bordeaux, France
Email verificata su ims-bordeaux.fr
Citato da 691
Characterization Compact Model Reliability Low-frequency Noise
Huan-Lin Chang

Huan-Lin Chang

Email verificata su ieee.org
Citato da 641
Compact model SPICE model
Thomas Jacquet

Thomas Jacquet

Citato da 123
electronics reliabilty compact model MBSA
Huaiyuan Zhang

Huaiyuan Zhang

Keysight Technologies
Email verificata su auburn.edu
Citato da 22
semiconductor device models heterojunction bipolar transistors compact model CMOS integrated circuits
Man Yang

Man Yang

NXP Semiconductors
Email verificata su nxp.com
Citato da 6
compact model SOI
Wang Shuhan

Wang Shuhan

Peking University
Email verificata su stu.pku.edu.cn
Citato da 1
compact model