Ikuti
Alan Hartman
Judul
Dikutip oleh
Dikutip oleh
Tahun
Problems and algorithms for covering arrays
A Hartman, L Raskin
Discrete Mathematics 284 (1), 149-156, 2004
3192004
Software and hardware testing using combinatorial covering suites
A Hartman
Graph Theory, Combinatorics and Algorithms, 237-266, 2005
2642005
The AGEDIS tools for model based testing
A Hartman, K Nagin
ACM SIGSOFT Software Engineering Notes 29 (4), 129-132, 2004
1972004
Maintaining Data Privacy in a Shared Data Storage System
S Cohen, A Hartman, JM Marberg, MG Moffie, K Nagin
US Patent App. 14/184,718, 2015
1792015
Using a model-based test generator to test for standard conformance
E Farchi, A Hartman, SS Pinter
IBM systems journal 41 (1), 89-110, 2002
1652002
A study in coverage-driven test generation
M Benjamin, D Geist, A Hartman, Y Wolfsthal, G Mas, R Smeets
Design Automation Conference, 1999. Proceedings. 36th, 970-975, 1999
1581999
Steiner quadruple systems
A Hartman, KT Phelps
Contemporary Design Theory, 205-240, 1992
1271992
Educating software and AI stakeholders about algorithmic fairness, accountability, transparency and ethics
V Bogina, A Hartman, T Kuflik, A Shulner-Tal
International Journal of Artificial Intelligence in Education, 1-26, 2022
1112022
Technique using persistent foci for finite state machine based software test generation
A Hartman, K Nagin, P Kram
US Patent 6,944,848, 2005
1062005
Projected state machine coverage for software testing
G Friedman, A Hartman, K Nagin, T Shiran
ACM SIGSOFT Software Engineering Notes 27 (4), 134-143, 2002
1032002
Model based test generation for validation of parallel and concurrent software
A Hartman, A Kirshin, K Nagin, S Olvovsky, A Zlotnick
US Patent 7,089,534, 2006
992006
The fundamental construction for 3-designs
A Hartman
Discrete Mathematics 124 (1-3), 107-132, 1994
921994
Resolvable group divisible designs with block size 3
AM Assaf, A Hartman
Discrete mathematics 77 (1-3), 5-20, 1989
791989
Reducing the complexity of finite state machine test generation using combinatorial designs
A Hartman, A Kirshin, K Nagin, S Olvovsky
US Patent 7,024,589, 2006
772006
Method and system for integrating test coverage measurements with model based test generation
E Farchi, D Geist, A Hartman, P Kram, K Nagin, Y Shaham-Gafni, S Ur
US Patent 7,272,752, 2007
752007
Using UML for automatic test generation
A Cavarra, C Crichton, J Davies, A Hartman, L Mounier
Proceedings of ISSTA 15, 2002
752002
Model based test generation tools
A Hartman
Agedis Consortium, URL: http://www. agedis. de/documents …, 2002
722002
2 nd UML 2 Semantics Symposium: Formal Semantics for UML
M Broy, ML Crane, J Dingel, A Hartman, B Rumpe, B Selic
Models in Software Engineering: Workshops and Symposia at MoDELS 2006, Genoa …, 2007
612007
Mitigating bias in algorithmic systems—a fish-eye view
K Orphanou, J Otterbacher, S Kleanthous, K Batsuren, F Giunchiglia, ...
ACM Computing Surveys 55 (5), 1-37, 2022
572022
Hyper-arc consistency in a contraint satisfaction network
R Emek, A Hartman, G Shurek, M Veksler
US Patent 7,085,748, 2006
572006
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