Ikuti
Thomas A. Germer
Thomas A. Germer
Email yang diverifikasi di nist.gov - Beranda
Judul
Dikutip oleh
Dikutip oleh
Tahun
Polarimetric BRDF in the microfacet model: Theory and measurements
RG Priest, TA Germer
Proceedings of the 2000 Meeting of the Military Sensing Symposia Specialty …, 2000
1832000
Picosecond time‐resolved adsorbate response to substrate heating: Spectroscopy and dynamics of CO/Cu (100)
TA Germer, JC Stephenson, EJ Heilweil, RR Cavanagh
The Journal of chemical physics 101 (2), 1704-1716, 1994
1661994
Goniometric optical scatter instrument for out-of-plane ellipsometry measurements
TA Germer, CC Asmail
Review of scientific Instruments 70 (9), 3688-3695, 1999
1511999
Angular dependence and polarization of out-of-plane optical scattering from particulate contamination, subsurface defects, and surface microroughness
TA Germer
Applied Optics 36 (33), 8798-8805, 1997
1371997
Modelling photovoltaic soiling losses through optical characterization
GP Smestad, TA Germer, H Alrashidi, EF Fernández, S Dey, H Brahma, ...
Scientific reports 10 (1), 58, 2020
1182020
Detection of circular polarization in light scattered from photosynthetic microbes
WB Sparks, J Hough, TA Germer, F Chen, S DasSarma, P DasSarma, ...
Proceedings of the National Academy of Sciences 106 (19), 7816-7821, 2009
1172009
Anisotropic, hierarchical surface patterns via surface wrinkling of nanopatterned polymer films
JH Lee, HW Ro, R Huang, P Lemaillet, TA Germer, CL Soles, CM Stafford
Nano letters 12 (11), 5995-5999, 2012
1042012
Fundamental limits of optical critical dimension metrology: a simulation study
R Silver, T Germer, R Attota, BM Barnes, B Bunday, J Allgair, E Marx, ...
Metrology, Inspection, and Process Control for Microlithography XXI 6518 …, 2007
1022007
Modeling the appearance of special effect pigment coatings
TA Germer, ME Nadal
Surface Scattering and Diffraction for Advanced Metrology 4447, 77-86, 2001
1002001
Size‐monodisperse metal nanoparticles via hydrogen‐free spray pyrolysis
JH Kim, TA Germer, GW Mulholland, SH Ehrman
Advanced Materials 14 (7), 518-521, 2002
992002
Polarization of light scattered by microrough surfaces and subsurface defects
TA Germer, CC Asmail
Journal of the Optical Society of America A 16 (6), 1326-1332, 1999
971999
Gaps analysis for CD metrology beyond the 22nm node
B Bunday, TA Germer, V Vartanian, A Cordes, A Cepler, C Settens
Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013
962013
Spectrophotometry: Accurate measurement of optical properties of materials
TA Germer, JC Zwinkels, BK Tsai
Elsevier, 2014
952014
Direct characterization of the hydroxyl intermediate during reduction of oxygen on Pt (111) by time-resolved electron energy loss spectroscopy
TA Germer, W Ho
Chemical physics letters 163 (4-5), 449-454, 1989
931989
Hot carrier excitation of adlayers: Time-resolved measurement of adsorbate-lattice coupling
TA Germer, JC Stephenson, EJ Heilweil, RR Cavanagh
Physical review letters 71 (20), 3327, 1993
891993
Picosecond measurement of substrate‐to‐adsorbate energy transfer: The frustrated translation of CO/Pt (111)
TA Germer, JC Stephenson, EJ Heilweil, RR Cavanagh
The Journal of chemical physics 98 (12), 9986-9994, 1993
871993
Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis
R Attota, TA Germer, RM Silver
Optics Letters 33 (17), 1990-1992, 2008
832008
Circular polarization in scattered light as a possible biomarker
WB Sparks, JH Hough, L Kolokolova, TA Germer, F Chen, S DasSarma, ...
Journal of Quantitative Spectroscopy and Radiative Transfer 110 (14-16 …, 2009
782009
Polarized light scattering by microroughness and small defects in dielectric layers
TA Germer
Journal of the Optical Society of America A 18 (6), 1279-1288, 2001
782001
Compact and robust method for full Stokes spectropolarimetry
W Sparks, TA Germer, JW MacKenty, F Snik
Applied Optics 51 (22), 5495-5511, 2012
772012
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