| Two photon absorption, nonlinear refraction, and optical limiting in semiconductors EW Van Stryland, H Vanherzeele, MA Woodall, MJ Soileau, AL Smirl, ... Optical Engineering 24 (4), 613-623, 1985 | 608 | 1985 |
| Energy band-gap dependence of two-photon absorption EW Van Stryland, MA Woodall, H Vanherzeele, MJ Soileau Optics letters 10 (10), 490-492, 1985 | 460 | 1985 |
| Nonlinear optical properties of carbon-black suspensions (ink) K Mansour, MJ Soileau, EW Van Stryland Journal of the Optical Society of America B 9 (7), 1100-1109, 1992 | 451 | 1992 |
| Nonlinear refraction and optical limiting in M Sheik-Bahae, AA Said, DJ Hagan, MJ Soileau, EW Van Stryland Optical engineering 30 (8), 1228-1235, 1991 | 353 | 1991 |
| Optical limiting with semiconductors EW Van Stryland, YY Wu, DJ Hagan, MJ Soileau, K Mansour Journal of the optical society of america B 5 (9), 1980-1988, 1988 | 316 | 1988 |
| Optical switching and n2 measurements in CS2 WE Williams, MJ Soileau, EW Van Stryland Optics communications 50 (4), 256-260, 1984 | 292 | 1984 |
| Color-center generation in silicate glasses exposed to infrared femtosecond pulses OM Efimov, K Gabel, SV Garnov, LB Glebov, S Grantham, M Richardson, ... Journal of the Optical Society of America B 15 (1), 193-199, 1998 | 183 | 1998 |
| Polarization charge model for laser-induced ripple patterns in dielectric materials P Temple, M Soileau IEEE Journal of Quantum Electronics 17 (10), 2067-2072, 1981 | 177 | 1981 |
| Laser-induced damage and the role of self-focusing MJ Soileau, WE Williams, N Mansour, EW Van Stryland Optical Engineering 28 (10), 1133-1144, 1989 | 162 | 1989 |
| Pulse-width and focal-volume dependence of laser-induced breakdown EW Van Stryland, MJ Soileau, AL Smirl, WE Williams Physical Review B 23 (5), 2144, 1981 | 162 | 1981 |
| Optical power limiter with picosecond response time M Soileau, W Williams, E Van Stryland IEEE Journal of Quantum Electronics 19 (4), 731-735, 1983 | 142 | 1983 |
| Self-protecting semiconductor optical limiters DJ Hagan, EW Van Stryland, MJ Soileau, YY Wu, S Guha Optics letters 13 (4), 315-317, 1988 | 94 | 1988 |
| Measurement of the optical damage threshold in fused quartz AA Said, T Xia, A Dogariu, DJ Hagan, MJ Soileau, EW Van Stryland, ... Applied optics 34 (18), 3374-3376, 1995 | 66 | 1995 |
| Self-defocusing in CdSe induced by charge carriers created by two-photon absorption S Guha, EW Van Stryland, MJ Soileau Optics letters 10 (6), 285-287, 1985 | 63 | 1985 |
| Z-scan: a simple and sensitive technique for nonlinear refraction measurements M Sheik-Bahae, AA Said, TH Wei, YY Wu, DJ Hagan, MJ Soileau, ... Nonlinear Optical Properties Of Materials 1148, 41-51, 1990 | 57 | 1990 |
| Ripple structures associated with ordered surface defects in dielectrics M Soileau IEEE journal of quantum electronics 20 (5), 464-467, 1984 | 50 | 1984 |
| High peak power Ytterbium doped fiber amplifiers W Torruellas, Y Chen, B McIntosh, J Farroni, K Tankala, S Webster, ... Fiber lasers III: technology, systems, and applications 6102, 149-155, 2006 | 46 | 2006 |
| Diffusion of color centers generated by two‐photon absorption at 532 nm in cubic zirconia N Mansour, K Mansour, EW Van Stryland, MJ Soileau Journal of applied physics 67 (3), 1475-1477, 1990 | 46 | 1990 |
| Picosecond air breakdown studies at 0.53 μm WE Williams, MJ Soileau, EW Van Stryland Applied physics letters 43 (4), 352-354, 1983 | 44 | 1983 |
| Picosecond damage studies at 0.5 and 1 µm MJ Soileau, WE Williams, EW Van Stryland, TF Boggess, AL Smirl Optical Engineering 22 (4), 424-430, 1983 | 44 | 1983 |