Ikuti
MJ Soileau
MJ Soileau
Prof. of Optics, Physics and EECS and VP for Research, UCF
Email yang diverifikasi di ucf.edu
Judul
Dikutip oleh
Dikutip oleh
Tahun
Two photon absorption, nonlinear refraction, and optical limiting in semiconductors
EW Van Stryland, H Vanherzeele, MA Woodall, MJ Soileau, AL Smirl, ...
Optical Engineering 24 (4), 613-623, 1985
6081985
Energy band-gap dependence of two-photon absorption
EW Van Stryland, MA Woodall, H Vanherzeele, MJ Soileau
Optics letters 10 (10), 490-492, 1985
4601985
Nonlinear optical properties of carbon-black suspensions (ink)
K Mansour, MJ Soileau, EW Van Stryland
Journal of the Optical Society of America B 9 (7), 1100-1109, 1992
4511992
Nonlinear refraction and optical limiting in
M Sheik-Bahae, AA Said, DJ Hagan, MJ Soileau, EW Van Stryland
Optical engineering 30 (8), 1228-1235, 1991
3531991
Optical limiting with semiconductors
EW Van Stryland, YY Wu, DJ Hagan, MJ Soileau, K Mansour
Journal of the optical society of america B 5 (9), 1980-1988, 1988
3161988
Optical switching and n2 measurements in CS2
WE Williams, MJ Soileau, EW Van Stryland
Optics communications 50 (4), 256-260, 1984
2921984
Color-center generation in silicate glasses exposed to infrared femtosecond pulses
OM Efimov, K Gabel, SV Garnov, LB Glebov, S Grantham, M Richardson, ...
Journal of the Optical Society of America B 15 (1), 193-199, 1998
1831998
Polarization charge model for laser-induced ripple patterns in dielectric materials
P Temple, M Soileau
IEEE Journal of Quantum Electronics 17 (10), 2067-2072, 1981
1771981
Laser-induced damage and the role of self-focusing
MJ Soileau, WE Williams, N Mansour, EW Van Stryland
Optical Engineering 28 (10), 1133-1144, 1989
1621989
Pulse-width and focal-volume dependence of laser-induced breakdown
EW Van Stryland, MJ Soileau, AL Smirl, WE Williams
Physical Review B 23 (5), 2144, 1981
1621981
Optical power limiter with picosecond response time
M Soileau, W Williams, E Van Stryland
IEEE Journal of Quantum Electronics 19 (4), 731-735, 1983
1421983
Self-protecting semiconductor optical limiters
DJ Hagan, EW Van Stryland, MJ Soileau, YY Wu, S Guha
Optics letters 13 (4), 315-317, 1988
941988
Measurement of the optical damage threshold in fused quartz
AA Said, T Xia, A Dogariu, DJ Hagan, MJ Soileau, EW Van Stryland, ...
Applied optics 34 (18), 3374-3376, 1995
661995
Self-defocusing in CdSe induced by charge carriers created by two-photon absorption
S Guha, EW Van Stryland, MJ Soileau
Optics letters 10 (6), 285-287, 1985
631985
Z-scan: a simple and sensitive technique for nonlinear refraction measurements
M Sheik-Bahae, AA Said, TH Wei, YY Wu, DJ Hagan, MJ Soileau, ...
Nonlinear Optical Properties Of Materials 1148, 41-51, 1990
571990
Ripple structures associated with ordered surface defects in dielectrics
M Soileau
IEEE journal of quantum electronics 20 (5), 464-467, 1984
501984
High peak power Ytterbium doped fiber amplifiers
W Torruellas, Y Chen, B McIntosh, J Farroni, K Tankala, S Webster, ...
Fiber lasers III: technology, systems, and applications 6102, 149-155, 2006
462006
Diffusion of color centers generated by two‐photon absorption at 532 nm in cubic zirconia
N Mansour, K Mansour, EW Van Stryland, MJ Soileau
Journal of applied physics 67 (3), 1475-1477, 1990
461990
Picosecond air breakdown studies at 0.53 μm
WE Williams, MJ Soileau, EW Van Stryland
Applied physics letters 43 (4), 352-354, 1983
441983
Picosecond damage studies at 0.5 and 1 µm
MJ Soileau, WE Williams, EW Van Stryland, TF Boggess, AL Smirl
Optical Engineering 22 (4), 424-430, 1983
441983
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