Fault diagnosis in microelectronics attachment via deep learning analysis of 3-D laser scans N Dimitriou, L Leontaris, T Vafeiadis, D Ioannidis, T Wotherspoon, ... IEEE transactions on industrial electronics 67 (7), 5748-5757, 2019 | 52 | 2019 |
A deep learning framework for simulation and defect prediction applied in microelectronics N Dimitriou, L Leontaris, T Vafeiadis, D Ioannidis, T Wotherspoon, ... Simulation Modelling Practice and Theory 100, 102063, 2020 | 38 | 2020 |
Deep multi-sensorial data analysis for production monitoring in hard metal industry T Kotsiopoulos, L Leontaris, N Dimitriou, D Ioannidis, F Oliveira, ... The International Journal of Advanced Manufacturing Technology 115, 823-836, 2021 | 23 | 2021 |
A blockchain-enabled deep residual architecture for accountable, in-situ quality control in industry 4.0 with minimal latency L Leontaris, A Mitsiaki, P Charalampous, N Dimitriou, E Leivaditou, ... Computers in Industry 149, 103919, 2023 | 18 | 2023 |
An autonomous illumination system for vehicle documentation based on deep reinforcement learning L Leontaris, N Dimitriou, D Ioannidis, K Votis, D Tzovaras, ... IEEE Access 9, 75336-75348, 2021 | 10 | 2021 |
A deep regression framework toward laboratory accuracy in the shop floor of microelectronics A Evangelidis, N Dimitriou, L Leontaris, D Ioannidis, G Tinker, D Tzovaras IEEE Transactions on Industrial Informatics 19 (3), 2652-2661, 2022 | 8 | 2022 |
An integrated system for automated 3D visualization and monitoring of vehicles S Bounareli, I Kleitsiotis, L Leontaris, N Dimitriou, A Pilalitou, ... The International Journal of Advanced Manufacturing Technology 111 (5), 1797 …, 2020 | 6 | 2020 |
Automated Defect Detection In Battery Line Assembly Via Deep Learning Analysis A Tzelepakis, L Leontaris, N Dimitriou, E Koukidou, D Bollas, ... Proceedings of the 10th ECCOMAS Thematic Conference on Smart Structures and …, 2023 | 2 | 2023 |
Time-series Forecasting in Industrial Environments: A Performance Study and a Novel Late Fusion Framework D Oikonomou, L Leontaris, N Dimitriou, D Tzovaras IEEE Sensors Journal, 2025 | | 2025 |
Inspection Of Surface Defects In Metal Processing Industry Using Unet-Based Architectures L Leontaris, N Dimitriou, A Nikolousis, D Tzovaras, E Papageorgiou Proceedings of the 10th ECCOMAS Thematic Conference on Smart Structures and …, 2023 | | 2023 |
DARLENE D9. 3: Project progress report-2nd year N Dimitriou | | 2022 |