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Fakultas Kedokteran Unsyiah
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Characterization, modeling, and application of 10-kV SiC MOSFET
J Wang, T Zhao, J Li, AQ Huang, R Callanan, F Husna, A Agarwal
IEEE Transactions on Electron Devices 55 (8), 1798-1806, 2008
4492008
Recent progress in SiC DMOSFETs and JBS diodes at Cree
RJ Callanan, A Agarwal, A Burk, M Das, B Hull, F Husna, A Powell, ...
2008 34th Annual Conference of IEEE Industrial Electronics, 2885-2890, 2008
1362008
A 13 kV 4H-SiC n-Channel IGBT with Low Rdiff,on and Fast Switching
MK Das, QJ Zhang, R Callanan, C Capell, J Clayton, M Donofrio, ...
Materials Science Forum 600, 1183-1186, 2009
1182009
High-Temperature Performance of AlGaN/GaN MOSHEMT WithGate Insulator Fabricated on Si (111) Substrate
F Husna, M Lachab, M Sultana, V Adivarahan, Q Fareed, A Khan
IEEE Transactions on Electron Devices 59 (9), 2424-2429, 2012
972012
10-kV SiC MOSFET-based boost converter
J Wang, X Zhou, J Li, T Zhao, AQ Huang, R Callanan, F Husna, A Agarwal
IEEE Transactions on Industry Applications 45 (6), 2056-2063, 2009
872009
High speed rectifier circuit
R Callanan, F Husna
US Patent 8,681,518, 2014
462014
State of the art 10 kV NMOS transistors
MK Das, R Callanan, DC Capell, B Hull, F Husna, J Richmond, ...
2008 20th International Symposium on Power Semiconductor Devices and IC's …, 2008
442008
20 A, 1200 V 4H-SiC DMOSFETs for energy conversion systems
B Hull, R Callanan, M Das, A Agarwal, F Husna, J Palmour
2009 IEEE Energy Conversion Congress and Exposition, 112-119, 2009
422009
Performance of 60 A, 1200 V 4H-SiC DMOSFETs
BA Hull, C Jonas, SH Ryu, MK Das, MJ O'Loughlin, F Husna, R Callanan, ...
Materials Science Forum 615, 749-752, 2009
362009
Transport properties of SiO2/AlInN/AlN/GaN metal–oxide–semiconductor high electron mobility transistors on SiC substrate
M Lachab, M Sultana, Q Fareed, F Husna, V Adivarahan, A Khan
Journal of Physics D: Applied Physics 47 (13), 135108, 2014
292014
A comparison of high temperature performance of SiC DMOSFETs and JFETs
SH Ryu, S Krishnaswami, BA Hull, B Heath, F Husna, J Richmond, ...
Materials science forum 556, 775-778, 2007
232007
4H-SiC bipolar junction transistors: From research to development-A case study: 1200 V, 20 A, stable SiC BJTs with high blocking yield
Q Zhang, A Burk, F Husna, R Callanan, A Agarwal, J Palmour, ...
2009 21st International Symposium on Power Semiconductor Devices & IC's, 339-342, 2009
222009
10 kV SiC MOSFET based boost converter
J Wang, J Li, X Zhou, T Zhao, AQ Huang, R Callanan, F Husna, A Agarwal
2008 IEEE Industry Applications Society Annual Meeting, 1-6, 2008
182008
Characterization of silicone gel properties for high power IGBT modules and MEMS
KS Siow, TF Chen, YW Chan, A Jalar, RM Vemal, ST Chua, F Husna
2015 IEEE Conference on Sustainable Utilization And Development In …, 2015
172015
Effect of recombination-induced stacking faults on majority carrier conduction and reverse leakage current on 10 kV SiC DMOSFETs
SH Ryu, F Husna, SK Haney, QCJ Zhang, RE Stahlbush, AK Agarwal
Materials Science Forum 600, 1127-1130, 2009
172009
Status of 1200v 4h-sic power dmosfets
BA Hull, MK Das, SH Ryu, SK Haney, C Jonas, C Capell, L Hall, ...
2007 International Semiconductor Device Research Symposium, 1-2, 2007
152007
Improved 4H-SiC MOS Interfaces produced via two independent processes: metal enhanced oxidation and 1300° C NO Anneal
MK Das, BA Hull, S Krishnaswami, F Husna, SK Haney, AJ Lelis, ...
Materials science forum 527, 967-970, 2006
142006
High temperature DC-DC converter performance comparison using SiC JFETs, BJTs and Si MOSFETs
JD Scofield, H Kosai, B Jordan, SH Ryu, S Krishnaswami, F Husna, ...
Materials science forum 556, 991-994, 2007
82007
Improved 4H-SiC MOS interfaces produced via two independent processes: Metal enhanced oxidation and 1300C NO Anneal
BA Hull, C Jonas, SH Ryu, M Das, M O’Loughlin, F Husna, R Callanan, ...
Materials Science Forum, 749-752, 2009
52009
First Demonstration of 2.1 kW Output Power at 425 MHz Using 4H-SiC RF Power BJTs
AK Agarwal, F Husna, J Haley, H Bartlow, B McCalpin, S Krishnaswami, ...
Materials science forum 527, 1413-1416, 2006
42006
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