Introduction to microelectronic fabrication RC Jaeger
Addison-Wesley Longman Publishing Co., Inc., 1987
1521 * 1987 Microelectronic circuit design RC Jaeger, TN Blalock
McGraw-Hill, 1997
785 1997 Heat sink optimization with application to microchannels RW Knight, DJ Hall, JS Goodling, RC Jaeger
IEEE Transactions on Components, Hybrids, and Manufacturing Technology 15 (5 …, 1992
568 1992 Silicon piezoresistive stress sensors and their application in electronic packaging JC Suhling, RC Jaeger
IEEE sensors journal 1 (1), 14-30, 2001
391 2001 A high-speed clamped bit-line current-mode sense amplifier TN Blalock, RC Jaeger
IEEE Journal of Solid-State Circuits 26 (4), 542-548, 1991
319 1991 A 12-Bit Vernier Ring Time-to-Digital Converter in 0.13 J Yu, FF Dai, RC Jaeger
IEEE journal of solid-state circuits 45 (4), 830-842, 2010
293 2010 Piezoresistive stress sensors for structural analysis of electronic packages DA Bittle, JC Suhling, RE Beaty, RC Jaeger, RW Johnson
274 1991 CMOS stress sensors on [100] silicon RC Jaeger, JC Suhling, R Ramani, AT Bradley, J Xu
IEEE journal of solid-state circuits 35 (1), 85-95, 2000
211 2000 Piezoresistive characteristics of short-channel MOSFETs on (100) silicon AT Bradley, RC Jaeger, JC Suhling, KJ O'Connor
IEEE Transactions on electron devices 48 (9), 2009-2015, 2001
195 2001 Evaluation of piezoresistive coefficient variation in silicon stress sensors using a four-point bending test fixture RE Beaty, RC Jaeger, JC Suhling, RW Johnson, RD Butler
IEEE Transactions on Components Hybrids and Manufacturing Technology 15 (5 …, 1992
169 1992 A high-speed sensing scheme for 1T dynamic RAMs utilizing the clamped bit-line sense amplifier TN Blalock, RC Jaeger
IEEE Journal of Solid-State Circuits 27 (4), 618-625, 1992
161 1992 Temperature dependent threshold behavior of depletion mode MOSFETs: characterization and simulation FH Gaensslen, RC Jaeger
Solid-State Electronics 22 (4), 423-430, 1979
149 * 1979 Errors associated with the design, calibration and application of piezoresistive stress sensors in (100) silicon RC Jaeger, JC Suhling, R Ramani
IEEE Transactions on Components, Packaging, and Manufacturing Technology …, 1994
148 1994 Comments on" An optimized output stage for MOS integrated circuits"[with reply] RC Jaeger, LW Linholm
IEEE Journal of Solid-State Circuits 10 (3), 185-186, 1975
133 1975 Characterization of the Temperature Dependence of the Piezoresistive Coefficients of Silicon From CH Cho, RC Jaeger, JC Suhling
IEEE Sensors Journal 8 (8), 1455-1468, 2008
106 2008 The van der Pauw stress sensor A Mian, JC Suhling, RC Jaeger
IEEE Sensors Journal 6 (2), 340-356, 2006
104 2006 Effect of nucleation site spacing on the pool boiling characteristics of a structured surface ND Nimkar, SH Bhavnani, RC Jaeger
International journal of heat and mass transfer 49 (17-18), 2829-2839, 2006
101 2006 Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors LS Vempati, JD Cressler, JA Babcock, RC Jaeger, DL Harame
IEEE journal of solid-state circuits 31 (10), 1458-1467, 1996
100 1996 Ionizing radiation tolerance of high-performance SiGe HBT's grown by UHV/CVD JA Babcock, JD Cressler, LS Vempati, SD Clark, RC Jaeger, DL Harame
IEEE transactions on Nuclear Science 42 (6), 1558-1566, 1995
100 1995 Simulation of impurity freezeout through numerical solution of Poisson's equation with application to MOS device behavior RC Jaeger, FH Gaensslen
IEEE Transactions on Electron Devices 27 (5), 914-920, 1980
97 1980 