Monte Carlo simulation of single event effects RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ...
IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010
287 2010 Impact of low-energy proton induced upsets on test methods and rate predictions BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ...
IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009
227 2009 Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design BD Olson, DR Ball, KM Warren, LW Massengill, NF Haddad, SE Doyle, ...
IEEE transactions on nuclear science 52 (6), 2132-2136, 2005
209 2005 The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM KM Warren, RA Weller, MH Mendenhall, RA Reed, DR Ball, CL Howe, ...
IEEE transactions on nuclear science 52 (6), 2125-2131, 2005
202 2005 Physics of multiple-node charge collection and impacts on single-event characterization and soft error rate prediction JD Black, PE Dodd, KM Warren
IEEE Transactions on Nuclear Science 60 (3), 1836-1851, 2013
196 2013 Impact of heavy ion energy and nuclear interactions on single-event upset and latchup in integrated circuits PE Dodd, JR Schwank, MR Shaneyfelt, JA Felix, P Paillet, ...
IEEE Transactions on Nuclear Science 54 (6), 2303-2311, 2007
148 2007 Impact of ion energy and species on single event effects analysis RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ...
IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007
142 2007 Analysis of parasitic PNP bipolar transistor mitigation using well contacts in 130 nm and 90 nm CMOS technology BD Olson, OA Amusan, S Dasgupta, LW Massengill, AF Witulski, ...
IEEE Transactions on Nuclear Science 54 (4), 894-897, 2007
122 2007 Characterizing SRAM single event upset in terms of single and multiple node charge collection JD Black, DR Ball Ii, WH Robinson, DM Fleetwood, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 55 (6), 2943-2947, 2008
112 2008 Application of RADSAFE to Model the Single Event Upset Response of a 0.25 KM Warren, RA Weller, BD Sierawski, RA Reed, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 54 (4), 898-903, 2007
93 2007 Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch KM Warren, BD Sierawski, RA Reed, RA Weller, C Carmichael, A Lesea, ...
IEEE Transactions on Nuclear Science 54 (6), 2419-2425, 2007
92 2007 Role of heavy-ion nuclear reactions in determining on-orbit single event error rates CL Howe, RA Weller, RA Reed, MH Mendenhall, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 52 (6), 2182-2188, 2005
91 2005 The contribution of low-energy protons to the total on-orbit SEU rate NA Dodds, MJ Martinez, PE Dodd, MR Shaneyfelt, FW Sexton, JD Black, ...
IEEE Transactions on Nuclear Science 62 (6), 2440-2451, 2015
90 2015 Implications of nuclear reactions for single event effects test methods and analysis RA Reed, RA Weller, RD Schrimpf, MH Mendenhall, KM Warren, ...
IEEE transactions on nuclear science 53 (6), 3356-3362, 2006
88 2006 Heavy ion testing and single event upset rate prediction considerations for a DICE flip-flop KM Warren, AL Sternberg, JD Black, RA Weller, RA Reed, ...
IEEE Transactions on Nuclear Science 56 (6), 3130-3137, 2009
82 2009 Physical processes and applications of the Monte Carlo radiative energy deposition (MRED) code RA Reed, RA Weller, MH Mendenhall, DM Fleetwood, KM Warren, ...
IEEE Transactions on Nuclear Science 62 (4), 1441-1461, 2015
81 2015 General framework for single event effects rate prediction in microelectronics RA Weller, RA Reed, KM Warren, MH Mendenhall, BD Sierawski, ...
IEEE Transactions on Nuclear Science 56 (6), 3098-3108, 2009
80 2009 SEU prediction from SET modeling using multi-node collection in bulk transistors and SRAMs down to the 65 nm technology node L Artola, G Hubert, KM Warren, M Gaillardin, RD Schrimpf, RA Reed, ...
IEEE Transactions on Nuclear Science 58 (3), 1338-1346, 2011
77 2011 CRÈME: The 2011 revision of the cosmic ray effects on micro-electronics code JH Adams, AF Barghouty, MH Mendenhall, RA Reed, BD Sierawski, ...
IEEE Transactions on Nuclear Science 59 (6), 3141-3147, 2012
74 2012 Integrating circuit level simulation and Monte-Carlo radiation transport code for single event upset analysis in SEU hardened circuitry KM Warren, AL Sternberg, RA Weller, MP Baze, LW Massengill, RA Reed, ...
IEEE Transactions on Nuclear Science 55 (6), 2886-2894, 2008
69 2008 