| VHDL: Analysis and modeling of digital systems Z Navabi McGraw-Hill, Inc., 1992 | 686 | 1992 |
| Digital system test and testable design Z Navabi Springer doi: https://doi. org/10.1007/978-1-4419-7548-5, 2011 | 146 | 2011 |
| EDXY–A low cost congestion-aware routing algorithm for network-on-chips P Lotfi-Kamran, AM Rahmani, M Daneshtalab, A Afzali-Kusha, Z Navabi Journal of Systems Architecture 56 (7), 256-264, 2010 | 123 | 2010 |
| Evaluation of pseudo adaptive XY routing using an object oriented model for NOC M Dehyadgari, M Nickray, A Afzali-Kusha, Z Navabi 2005 International Conference on Microelectronics, 5 pp., 2005 | 116 | 2005 |
| Online NoC switch fault detection and diagnosis using a high level fault model A Alaghi, N Karimi, M Sedghi, Z Navabi 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007 | 91 | 2007 |
| Verilog digital system design Z Navabi McGraw-Hill, 1999 | 87* | 1999 |
| Digital design and implementation with field programmable devices Z Navabi Springer Science & Business Media, 2004 | 85 | 2004 |
| Embedded core design with FPGAs Z Navabi McGraw-Hill Professional, 2006 | 84 | 2006 |
| A near-threshold 7T SRAM cell with high write and read margins and low write time for sub-20 nm FinFET technologies M Ansari, H Afzali-Kusha, B Ebrahimi, Z Navabi, A Afzali-Kusha, ... Integration 50, 91-106, 2015 | 80 | 2015 |
| BARP-a dynamic routing protocol for balanced distribution of traffic in NoCs P Lotfi-Kamran, M Daneshtalab, C Lucas, Z Navabi Proceedings of the conference on Design, automation and test in Europe, 1408 …, 2008 | 75 | 2008 |
| A concurrent testing method for NoC switches M Hosseinabady, A Banaiyan, MN Bojnordi, Z Navabi Proceedings of the Design Automation & Test in Europe Conference 1, 6 pp., 2006 | 68 | 2006 |
| TruncApp: A truncation-based approximate divider for energy efficient DSP applications S Vahdat, M Kamal, A Afzali-Kusha, M Pedram, Z Navabi Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 65 | 2017 |
| An efficient BIST method for testing of embedded SRAMs MH Tehranipour, Z Navabi, SM Fakhraie ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems …, 2001 | 63 | 2001 |
| NoC hot spot minimization using AntNet dynamic routing algorithm M Daneshtalab, A Sobhani, A Afzali-Kusha, O Fatemi, Z Navabi IEEE 17th International Conference on Application-specific Systems …, 2006 | 62 | 2006 |
| Using the inter-and intra-switch regularity in NoC switch testing M Hosseinabady, A Dalirsani, Z Navabi 2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007 | 60 | 2007 |
| VHDL: modular design and synthesis of cores and systems Z Navabi McGraw-Hill Professional, 2006 | 53 | 2006 |
| Real-time embedded emotional controller MR Jamali, M Dehyadegari, A Arami, C Lucas, Z Navabi Neural Computing and Applications 19, 13-19, 2010 | 49 | 2010 |
| Emotion on FPGA: Model driven approach MR Jamali, A Arami, M Dehyadegari, C Lucas, Z Navabi Expert Systems with Applications 36 (4), 7369-7378, 2009 | 49 | 2009 |
| Simultaneous reduction of dynamic and static power in scan structures S Sharifi, J Jaffari, M Hosseinabady, A Afzali-Kusha, Z Navabi Design, Automation and Test in Europe, 846-851, 2005 | 47 | 2005 |
| Reliability in application specific mesh-based NoC architectures F Refan, H Alemzadeh, S Safari, P Prinetto, Z Navabi 2008 14th IEEE International On-Line Testing Symposium, 207-212, 2008 | 46 | 2008 |
