Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques N Hellgren, J Guo, Y Luo, C Såthe, A Agui, S Kashtanov, J Nordgren, ...
Thin Solid Films 471 (1-2), 19-34, 2005
173 2005 X-ray spectroscopic studies of low dielectric constant parylene and fluorinated amorphous carbon films Y Ma, H Yang, J Guo, C Sathe, A Agui, JE Nordgren
Applied Physics Letters 72, 1998
164 1998 Structural and electronic properties of low dielectric constant fluorinated amorphous carbon films Y Ma, H Yang, J Guo, C Sathe, A Agui, J Nordgren
Applied Physics Letters 72 (25), 3353-3355, 1998
135 1998 Nitrogen bonding structure in carbon nitride thin films studied by soft x-ray spectroscopy N Hellgren, J Guo, C Såthe, A Agui, J Nordgren, Y Luo, H Ågren, ...
Applied Physics Letters 79 (26), 4348-4350, 2001
122 2001 First results from the actinide science beamline BL23SU at SPring-8 Y Saitoh, T Nakatani, T Matsushita, A Agui, A Yoshigoe, Y Teraoka, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
104 2001 Suppression of temperature hysteresis in negative thermal expansion compound BiNi1− xFexO3 and zero-thermal expansion composite K Nabetani, Y Muramatsu, K Oka, K Nakano, H Hojo, M Mizumaki, A Agui, ...
Applied Physics Letters 106 (6), 2015
88 2015 Soft x‐ray emission spectrometer for undulator radiation S Shin, A Agui, M Fujisawa, Y Tezuka, T Ishii, N Hirai
Review of scientific instruments 66 (2), 1584-1586, 1995
78 1995 Various valence states of square-coordinated mn in a-site-ordered perovskites Y Long, T Saito, M Mizumaki, A Agui, Y Shimakawa
Journal of the American Chemical Society 131 (44), 16244-16247, 2009
74 2009 Resonant soft-x-ray emission study in relation to the band structure of cBN A Agui, S Shin, M Fujisawa, Y Tezuka, T Ishii, Y Muramatsu, O Mishima, ...
Physical Review B 55 (4), 2073, 1997
66 1997 The electronic structure of polyaniline and doped phases studied by soft X-ray absorption and emission spectroscopies M Magnuson, JH Guo, SM Butorin, A Agui, C Såthe, J Nordgren, ...
The Journal of chemical physics 111 (10), 4756-4761, 1999
62 1999 Varied line‐spacing plane grating monochromator for undulator beamline M Fujisawa, A Harasawa, A Agui, M Watanabe, A Kakizaki, S Shin, T Ishii, ...
Review of scientific instruments 67 (2), 345-349, 1996
61 1996 Resonant soft X-ray emission study of rutile (TiO2) Y Tezuka, S Shin, A Agui, M Fujisawa, T Ishii
Journal of the Physical Society of Japan 65 (1), 312-317, 1996
58 1996 Melting of Pb Charge Glass and Simultaneous Pb–Cr Charge Transfer in PbCrO3 as the Origin of Volume Collapse R Yu, H Hojo, T Watanuki, M Mizumaki, T Mizokawa, K Oka, H Kim, ...
Journal of the American Chemical Society 137 (39), 12719-12728, 2015
53 2015 Electron holography: A maximum entropy reconstruction scheme T Matsushita, A Yoshigoe, A Agui
Europhysics Letters 71 (4), 597, 2005
52 2005 Observation of resonant Raman scattering at the Si S Shin, A Agui, M Watanabe, M Fujisawa, Y Tezuka, T Ishii
Physical Review B 53 (23), 15660, 1996
49 1996 Resonant soft x-ray Raman scattering of NiO M Magnuson, SM Butorin, A Agui, J Nordgren
Journal of Physics: Condensed Matter 14 (13), 3669, 2002
48 2002 Intermetallic charge transfer and band gap of MTiO3 (M= Mn, Fe, Co, and Ni) studied by O 1s-edge X-ray emission spectroscopy A Agui, M Mizumaki
Journal of Electron Spectroscopy and Related Phenomena 184 (8-10), 463-467, 2011
47 2011 A new approach for three-dimensional atomic-image reconstruction from a single-energy photoelectron hologram T Matsushita, A Agui, A Yoshigoe
Europhysics Letters 65 (2), 207, 2004
46 2004 Oxygen K-edge X-ray absorption near edge structures (XANES) of sublimated films of amino acids M Tanaka, K Nakagawa, T Koketsu, A Agui, A Yokoya
Journal of Synchrotron Radiation 8 (2), 1009-1011, 2001
42 2001 Electronic structure of single-wall carbon nanotubes studied by resonant inelastic X-ray scattering S Eisebitt, A Karl, W Eberhardt, JE Fischer, C Sathe, A Agui, J Nordgren
Applied Physics-Section A-Materials Science and Processing 67 (1), 89-94, 1998
42 1998 