| Understanding the Effects of Cationic Dopants on α-MnO2 Oxygen Reduction Reaction Electrocatalysis TN Lambert, JA Vigil, SE White, CJ Delker, DJ Davis, M Kelly, ... The Journal of Physical Chemistry C 121 (5), 2789-2797, 2017 | 88 | 2017 |
| Understanding the impact of Schottky barriers on the performance of narrow bandgap nanowire field effect transistors Y Zhao, D Candebat, C Delker, Y Zi, D Janes, J Appenzeller, C Yang Nano letters 12 (10), 5331-5336, 2012 | 66 | 2012 |
| Room temperature device performance of electrodeposited InSb nanowire field effect transistors SR Das, CJ Delker, D Zakharov, YP Chen, TD Sands, DB Janes Applied Physics Letters 98 (24), 2011 | 61 | 2011 |
| Low-frequency noise in MoSe2 field effect transistors SR Das, J Kwon, A Prakash, CJ Delker, S Das, DB Janes Applied Physics Letters 106 (8), 2015 | 60 | 2015 |
| Introduction to statistics in metrology S Crowder, C Delker, E Forrest, N Martin Springer, 2020 | 44 | 2020 |
| Nanoscale Carbon Modified α-MnO2 Nanowires: Highly Active and Stable Oxygen Reduction Electrocatalysts with Low Carbon Content JA Vigil, TN Lambert, J Duay, CJ Delker, TE Beechem, BS Swartzentruber ACS applied materials & interfaces 10 (2), 2040-2050, 2018 | 43 | 2018 |
| Low-frequency noise contributions from channel and contacts in InAs nanowire transistors CJ Delker, Y Zi, C Yang, DB Janes IEEE transactions on electron devices 60 (9), 2900-2905, 2013 | 32 | 2013 |
| 1/f noise sources in dual-gated indium arsenide nanowire transistors CJ Delker, S Kim, M Borg, LE Wernersson, DB Janes IEEE transactions on electron devices 59 (7), 1980-1987, 2012 | 20 | 2012 |
| Oxygen plasma exposure effects on indium oxide nanowire transistors S Kim, C Delker, P Chen, C Zhou, S Ju, DB Janes Nanotechnology 21 (14), 145207, 2010 | 20 | 2010 |
| Current and noise properties of InAs nanowire transistors with asymmetric contacts induced by gate overlap CJ Delker, Y Zi, C Yang, DB Janes IEEE Transactions on Electron Devices 61 (3), 884-889, 2014 | 12 | 2014 |
| Calculating interval uncertainties for calibration standards that drift with time CJ Delker, EC Auden, OM Solomon NCSLI Measure 12 (4), 9-20, 2018 | 11 | 2018 |
| Transitions between channel and contact regimes of low-frequency noise in many-layer MoS2 field effect transistors J Kwon, JH Park, CJ Delker, CT Harris, B Swartzentruber, SR Das, ... Applied Physics Letters 114 (11), 2019 | 9 | 2019 |
| Molybdenum Contacts to MoS2 Field‐Effect Transistors: Schottky Barrier Extraction, Electrical Transport, and Low‐Frequency Noise J Kwon, CJ Delker, DB Janes, CT Harris, SR Das physica status solidi (a) 217 (17), 1900880, 2020 | 8 | 2020 |
| Experimental and modeling study of 1/f noise in multilayer MoS2 and MoSe2 field-effect transistors J Kwon, CJ Delker, C Thomas Harris, SR Das, DB Janes Journal of Applied Physics 128 (9), 2020 | 6 | 2020 |
| Evaluating risk in an abnormal world: how arbitrary probability distributions affect false accept and reject evaluation. CJ Delker Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2020 | 6 | 2020 |
| Monte Carlo methods for the propagation of uncertainties S Crowder, C Delker, E Forrest, N Martin, S Crowder, C Delker, E Forrest, ... Introduction to statistics in metrology, 153-180, 2020 | 6 | 2020 |
| High-Performance and Ultralow-Noise Two-Dimensional Heterostructure Field-Effect Transistors with One-Dimensional Electrical Contacts AK Behera, CT Harris, DV Pete, CJ Delker, PE Vullum, MB Muniz, ... ACS Applied Electronic Materials 3 (9), 4126-4134, 2021 | 3 | 2021 |
| Exploration of a data-enhanced calibration certificate as part of a complete measurement information infrastructure. CJ Delker, A Robinson, MJ Roberts Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2020 | 2 | 2020 |
| Dual-gate operation and carrier transport in SiGe p–n junction nanowires CJ Delker, JY Yoo, E Bussmann, BS Swartzentruber, CT Harris Nanotechnology 28 (46), 46LT01, 2017 | 2 | 2017 |
| Temperature dependence of current and low-frequency noise in InAs nanowire transistors CJ Delker, Y Zi, C Yang, DB Janes 71st Device Research Conference, 57-58, 2013 | 2 | 2013 |
