| Impact of low-energy proton induced upsets on test methods and rate predictions BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ... IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009 | 227 | 2009 |
| Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM DF Heidel, PW Marshall, JA Pellish, KP Rodbell, KA LaBel, JR Schwank, ... IEEE Transactions on Nuclear Science 56 (6), 3499-3504, 2009 | 203 | 2009 |
| Muon-induced single event upsets in deep-submicron technology BD Sierawski, MH Mendenhall, RA Reed, MA Clemens, RA Weller, ... IEEE Transactions on Nuclear Science 57 (6), 3273-3278, 2010 | 147 | 2010 |
| Impact of ion energy and species on single event effects analysis RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ... IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007 | 142 | 2007 |
| Multiple-bit upset in 130 nm CMOS technology AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ... IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006 | 142 | 2006 |
| Device-orientation effects on multiple-bit upset in 65 nm SRAMs AD Tipton, JA Pellish, JM Hutson, R Baumann, X Deng, A Marshall, ... IEEE Transactions on Nuclear Science 55 (6), 2880-2885, 2008 | 91 | 2008 |
| The contribution of low-energy protons to the total on-orbit SEU rate NA Dodds, MJ Martinez, PE Dodd, MR Shaneyfelt, FW Sexton, JD Black, ... IEEE Transactions on Nuclear Science 62 (6), 2440-2451, 2015 | 90 | 2015 |
| Electron-induced single-event upsets in static random access memory MP King, RA Reed, RA Weller, MH Mendenhall, RD Schrimpf, ... IEEE Transactions on Nuclear Science 60 (6), 4122-4129, 2013 | 83 | 2013 |
| 32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches KP Rodbell, DF Heidel, JA Pellish, PW Marshall, HHK Tang, CE Murray, ... IEEE Transactions on Nuclear Science 58 (6), 2702-2710, 2011 | 72 | 2011 |
| An evaluation of transistor-layout RHBD techniques for SEE mitigation in SiGe HBTs AK Sutton, M Bellini, JD Cressler, JA Pellish, RA Reed, PW Marshall, ... IEEE Transactions on Nuclear Science 54 (6), 2044-2052, 2007 | 70 | 2007 |
| An investigation of dose rate and source dependent effects in 200 GHz SiGe HBTs AK Sutton, APG Prakash, B Jun, E Zhao, M Bellini, J Pellish, ... IEEE Transactions on Nuclear Science 53 (6), 3166-3174, 2006 | 68 | 2006 |
| Effectiveness of SEL hardening strategies and the latchup domino effect NA Dodds, NC Hooten, RA Reed, RD Schrimpf, JH Warner, NJH Roche, ... IEEE Transactions on Nuclear Science 59 (6), 2642-2650, 2012 | 65 | 2012 |
| Substrate engineering concepts to mitigate charge collection in deep trench isolation technologies JA Pellish, RA Reed, RD Schrimpf, ML Alles, M Varadharajaperumal, ... IEEE Transactions on Nuclear Science 53 (6), 3298-3305, 2006 | 63 | 2006 |
| Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam NA Dodds, JR Schwank, MR Shaneyfelt, PE Dodd, BL Doyle, M Trinczek, ... IEEE Transactions on Nuclear Science 61 (6), 2904-2914, 2014 | 58 | 2014 |
| Evaluation of digital micromirror devices for use in space-based multiobject spectrometer application A Travinsky, D Vorobiev, Z Ninkov, A Raisanen, MA Quijada, SA Smee, ... Journal of Astronomical Telescopes, Instruments, and Systems 3 (3), 035003 …, 2017 | 52 | 2017 |
| Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs JA Pellish, RA Reed, D McMorrow, G Vizkelethy, VF Cavrois, J Baggio, ... IEEE Transactions on Nuclear Science 56 (6), 3078-3084, 2009 | 52 | 2009 |
| Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements JR Schwank, MR Shaneyfelt, D McMorrow, V Ferlet-Cavrois, P Dodd, ... IEEE Transactions on Nuclear Science 57 (4), 1827-1834, 2010 | 51 | 2010 |
| Laser-induced current transients in silicon-germanium HBTs JA Pellish, RA Reed, D McMorrow, JS Melinger, P Jenkins, AK Sutton, ... IEEE Transactions on Nuclear Science 55 (6), 2936-2942, 2008 | 51 | 2008 |
| Predicting thermal neutron-induced soft errors in static memories using TCAD and physics-based Monte Carlo simulation tools KM Warren, BD Sierawski, RA Weller, RA Reed, MH Mendenhall, ... IEEE electron device letters 28 (2), 180-182, 2007 | 44 | 2007 |
| SEL-sensitive area mapping and the effects of reflection and diffraction from metal lines on laser SEE testing NA Dodds, NC Hooten, RA Reed, RD Schrimpf, JH Warner, NJH Roche, ... IEEE Transactions on Nuclear Science 60 (4), 2550-2558, 2013 | 41 | 2013 |