Flash memory cells-an overview P Pavan, R Bez, P Olivo, E Zanoni Proceedings of the IEEE 85 (8), 1248-1271, 1997 | 1093 | 1997 |
NROM: A novel localized trapping, 2-bit nonvolatile memory cell B Eitan, P Pavan, I Bloom, E Aloni, A Frommer, D Finzi IEEE Electron Device Letters 21 (11), 543-545, 2000 | 884 | 2000 |
Recommended methods to study resistive switching devices M Lanza, HSP Wong, E Pop, D Ielmini, D Strukov, BC Regan, L Larcher, ... Advanced Electronic Materials 5 (1), 1800143, 2019 | 626 | 2019 |
Can NROM, a 2 bit, trapping storage NVM cell, give a real challenge to floating gate cells? B Eitan, P Pavan, I Bloom, E Aloni, A Frommer SSDM 100, 522-524, 1999 | 212 | 1999 |
Impact of programming charge distribution on threshold voltage and subthreshold slope of NROM memory cells L Larcher, G Verzellesi, P Pavan, E Lusky, I Bloom, B Eitan IEEE Transactions on Electron Devices 49 (11), 1939-1946, 2002 | 148 | 2002 |
A Complete Statistical Investigation of RTN in HfO2-Based RRAM in High Resistive State FM Puglisi, L Larcher, A Padovani, P Pavan IEEE Transactions on Electron Devices 62 (8), 2606-2613, 2015 | 133 | 2015 |
A solar energy harvesting circuit for low power applications D Dondi, A Bertacchini, L Larcher, P Pavan, D Brunelli, L Benini 2008 IEEE International Conference on Sustainable Energy Technologies, 945-949, 2008 | 122 | 2008 |
NROMTM––a new technology for non-volatile memory products I Bloom, P Pavan, B Eitan Solid-State Electronics 46 (11), 1757-1763, 2002 | 112 | 2002 |
Carbon-doped GeTe: a promising material for phase-change memories GB Beneventi, L Perniola, V Sousa, E Gourvest, S Maitrejean, JC Bastien, ... Solid-State Electronics 65, 197-204, 2011 | 101 | 2011 |
Photovoltaic cell modeling for solar energy powered sensor networks D Dondi, D Brunelli, L Benini, P Pavan, A Bertacchini, L Larcher 2007 2nd international workshop on advances in sensors and interface, 1-6, 2007 | 92 | 2007 |
An empirical model for RRAM resistance in low-and high-resistance states FM Puglisi, L Larcher, G Bersuker, A Padovani, P Pavan IEEE Electron Device Letters 34 (3), 387-389, 2013 | 89 | 2013 |
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis L Larcher, FM Puglisi, P Pavan, A Padovani, L Vandelli, G Bersuker IEEE Transactions on Electron Devices 61 (8), 2668-2673, 2014 | 88 | 2014 |
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices L Vandelli, A Padovani, L Larcher, G Broglia, G Ori, M Montorsi, ... 2011 International Electron Devices Meeting, 17.5. 1-17.5. 4, 2011 | 88 | 2011 |
Floating gate devices: operation and compact modeling P Pavan, L Larcher, A Marmiroli Springer Science & Business Media, 2007 | 85 | 2007 |
Random telegraph noise in resistive random access memories: Compact modeling and advanced circuit design FM Puglisi, N Zagni, L Larcher, P Pavan IEEE Transactions on Electron Devices 65 (7), 2964-2972, 2018 | 84 | 2018 |
Charge Transport and Degradation in HfO2 and HfOx Dielectrics A Padovani, L Larcher, G Bersuker, P Pavan IEEE electron device letters 34 (5), 680-682, 2013 | 84 | 2013 |
Smart logic-in-memory architecture for low-power non-von neumann computing T Zanotti, FM Puglisi, P Pavan IEEE Journal of the Electron Devices Society 8, 757-764, 2020 | 64 | 2020 |
Photovoltaic scavenging systems: Modeling and optimization D Brunelli, D Dondi, A Bertacchini, L Larcher, P Pavan, L Benini Microelectronics Journal 40 (9), 1337-1344, 2009 | 62 | 2009 |
Analytical model for low-frequency noise in amorphous chalcogenide-based phase-change memory devices G Betti Beneventi, A Calderoni, P Fantini, L Larcher, P Pavan Journal of Applied Physics 106 (5), 2009 | 62 | 2009 |
“Hole Redistribution” Model Explaining the Thermally Activated RON Stress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs N Zagni, A Chini, FM Puglisi, M Meneghini, G Meneghesso, E Zanoni, ... IEEE Transactions on Electron Devices 68 (2), 697-703, 2021 | 60 | 2021 |