| Monte Carlo simulation of single event effects RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ... IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010 | 287 | 2010 |
| Impact of low-energy proton induced upsets on test methods and rate predictions BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ... IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009 | 227 | 2009 |
| Muon-induced single event upsets in deep-submicron technology BD Sierawski, MH Mendenhall, RA Reed, MA Clemens, RA Weller, ... IEEE Transactions on Nuclear Science 57 (6), 3273-3278, 2010 | 147 | 2010 |
| Impact of ion energy and species on single event effects analysis RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ... IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007 | 142 | 2007 |
| Multiple-bit upset in 130 nm CMOS technology AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ... IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006 | 142 | 2006 |
| Ion-induced energy pulse mechanism for single-event burnout in high-voltage SiC power MOSFETs and junction barrier Schottky diodes DR Ball, KF Galloway, RA Johnson, ML Alles, AL Sternberg, BD Sierawski, ... IEEE Transactions on Nuclear Science 67 (1), 22-28, 2019 | 107 | 2019 |
| Effects of scaling on muon-induced soft errors BD Sierawski, RA Reed, MH Mendenhall, RA Weller, RD Schrimpf, ... 2011 International Reliability Physics Symposium, 3C. 3.1-3C. 3.6, 2011 | 98 | 2011 |
| Application of RADSAFE to Model the Single Event Upset Response of a 0.25 m CMOS SRAM KM Warren, RA Weller, BD Sierawski, RA Reed, MH Mendenhall, ... IEEE Transactions on Nuclear Science 54 (4), 898-903, 2007 | 93 | 2007 |
| Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch KM Warren, BD Sierawski, RA Reed, RA Weller, C Carmichael, A Lesea, ... IEEE Transactions on Nuclear Science 54 (6), 2419-2425, 2007 | 92 | 2007 |
| The contribution of low-energy protons to the total on-orbit SEU rate NA Dodds, MJ Martinez, PE Dodd, MR Shaneyfelt, FW Sexton, JD Black, ... IEEE Transactions on Nuclear Science 62 (6), 2440-2451, 2015 | 90 | 2015 |
| Electron-induced single-event upsets in static random access memory MP King, RA Reed, RA Weller, MH Mendenhall, RD Schrimpf, ... IEEE Transactions on Nuclear Science 60 (6), 4122-4129, 2013 | 83 | 2013 |
| Physical processes and applications of the Monte Carlo radiative energy deposition (MRED) code RA Reed, RA Weller, MH Mendenhall, DM Fleetwood, KM Warren, ... IEEE Transactions on Nuclear Science 62 (4), 1441-1461, 2015 | 81 | 2015 |
| General framework for single event effects rate prediction in microelectronics RA Weller, RA Reed, KM Warren, MH Mendenhall, BD Sierawski, ... IEEE Transactions on Nuclear Science 56 (6), 3098-3108, 2009 | 80 | 2009 |
| CRÈME: The 2011 revision of the cosmic ray effects on micro-electronics code JH Adams, AF Barghouty, MH Mendenhall, RA Reed, BD Sierawski, ... IEEE Transactions on Nuclear Science 59 (6), 3141-3147, 2012 | 74 | 2012 |
| Heavy-ion-induced current transients in bulk and SOI FinFETs F El-Mamouni, EX Zhang, DR Ball, B Sierawski, MP King, RD Schrimpf, ... IEEE Transactions on Nuclear Science 59 (6), 2674-2681, 2012 | 61 | 2012 |
| Radiation hardness of FDSOI and FinFET technologies ML Alles, RD Schrimpf, RA Reed, LW Massengill, RA Weller, ... IEEE 2011 International SOI Conference, 1-2, 2011 | 55 | 2011 |
| Effects of multi-node charge collection in flip-flop designs at advanced technology nodes VB Sheshadri, BL Bhuva, RA Reed, RA Weller, MH Mendenhall, ... 2010 IEEE International Reliability Physics Symposium, 1026-1030, 2010 | 52 | 2010 |
| Estimating terrestrial neutron-induced SEB cross sections and FIT rates for high-voltage SiC power MOSFETs DR Ball, BD Sierawski, KF Galloway, RA Johnson, ML Alles, AL Sternberg, ... IEEE Transactions on Nuclear Science 66 (1), 337-343, 2018 | 48 | 2018 |
| Dose Enhancement and Reduction in SiO and High- MOS Insulators A Dasgupta, DM Fleetwood, RA Reed, RA Weller, MH Mendenhall, ... IEEE Transactions on Nuclear Science 57 (6), 3463-3469, 2010 | 47 | 2010 |
| Reducing soft error rate in logic circuits through approximate logic functions BD Sierawski, BL Bhuva, LW Massengill IEEE transactions on nuclear science 53 (6), 3417-3421, 2006 | 46 | 2006 |
