دنبال کردن
Carlo De Santi
Carlo De Santi
Assistant professor, UNIPD
ایمیل تأیید شده در unipd.it
عنوان
نقل شده توسط
نقل شده توسط
سال
The 2018 GaN power electronics roadmap‏
H Amano, Y Baines, E Beam, M Borga, T Bouchet, PR Chalker, M Charles, ...‏
Journal of Physics D: Applied Physics 51 (16), 163001, 2018‏
11962018
The 2020 UV emitter roadmap‏
H Amano, R Collazo, C De Santi, S Einfeldt, M Funato, J Glaab, ...‏
Journal of Physics D: Applied Physics 53 (50), 503001, 2020‏
4472020
Deep-level characterization in GaN HEMTs-Part I: Advantages and limitations of drain current transient measurements‏
D Bisi, M Meneghini, C De Santi, A Chini, M Dammann, P Brueckner, ...‏
IEEE Transactions on electron devices 60 (10), 3166-3175, 2013‏
4362013
GaN-based power devices: Physics, reliability, and perspectives‏
M Meneghini, C De Santi, I Abid, M Buffolo, M Cioni, RA Khadar, L Nela, ...‏
Journal of Applied Physics 130 (18), 2021‏
3972021
Time-dependent failure of GaN-on-Si power HEMTs with p-GaN gate‏
I Rossetto, M Meneghini, O Hilt, E Bahat-Treidel, C De Santi, S Dalcanale, ...‏
IEEE Transactions on Electron Devices 63 (6), 2334-2339, 2016‏
1542016
Evidence of hot-electron effects during hard switching of AlGaN/GaN HEMTs‏
I Rossetto, M Meneghini, A Tajalli, S Dalcanale, C De Santi, P Moens, ...‏
IEEE transactions on electron devices 64 (9), 3734-3739, 2017‏
1302017
Time-and field-dependent trapping in GaN-based enhancement-mode transistors with p-gate‏
M Meneghini, C De Santi, T Ueda, T Tanaka, D Ueda, E Zanoni, ...‏
IEEE Electron device letters 33 (3), 375-377, 2012‏
1182012
Reliability and failure analysis in power GaN-HEMTs: An overview‏
M Meneghini, I Rossetto, C De Santi, F Rampazzo, A Tajalli, A Barbato, ...‏
2017 IEEE International Reliability Physics Symposium (IRPS), 3B-2.1-3B-2.8, 2017‏
1152017
Defect-related degradation of AlGaN-based UV-B LEDs‏
D Monti, M Meneghini, C De Santi, G Meneghesso, E Zanoni, J Glaab, ...‏
IEEE Transactions on Electron Devices 64 (1), 200-205, 2016‏
822016
Role of defects in the thermal droop of InGaN-based light emitting diodes‏
C De Santi, M Meneghini, M La Grassa, B Galler, R Zeisel, M Goano, ...‏
Journal of Applied Physics 119 (9), 2016‏
772016
Degradation of AlGaN/GaN HEMT devices: Role of reverse-bias and hot electron stress‏
G Meneghesso, M Meneghini, A Stocco, D Bisi, C de Santi, I Rossetto, ...‏
Microelectronic engineering 109, 257-261, 2013‏
742013
Laser-based lighting: experimental analysis and perspectives‏
N Trivellin, M Yushchenko, M Buffolo, C De Santi, M Meneghini, ...‏
Materials 10 (10), 1166, 2017‏
702017
Investigation of the deep level involved in InGaN laser degradation by deep level transient spectroscopy‏
M Meneghini, C de Santi, N Trivellin, K Orita, S Takigawa, T Tanaka, ...‏
Applied Physics Letters 99 (9), 2011‏
682011
Thermal droop in III-nitride based light-emitting diodes: Physical origin and perspectives‏
M Meneghini, C De Santi, A Tibaldi, M Vallone, F Bertazzi, G Meneghesso, ...‏
Journal of applied Physics 127 (21), 2020‏
652020
Defects and reliability of GaN‐based LEDs: review and perspectives‏
M Buffolo, A Caria, F Piva, N Roccato, C Casu, C De Santi, N Trivellin, ...‏
physica status solidi (a) 219 (8), 2100727, 2022‏
592022
A Novel Physics-Based Approach to Analyze and Model E-Mode p-GaN Power HEMTs‏
N Modolo, SW Tang, HJ Jiang, C De Santi, M Meneghini, TL Wu‏
IEEE Transactions on Electron Devices 68 (4), 1489-1494, 2020‏
482020
Recombination mechanisms and thermal droop in AlGaN-based UV-B LEDs‏
C De Santi, M Meneghini, D Monti, J Glaab, M Guttmann, J Rass, ...‏
Photonics Research 5 (2), A44-A51, 2017‏
482017
UV-based technologies for SARS-CoV2 inactivation: Status and perspectives‏
N Trivellin, F Piva, D Fiorimonte, M Buffolo, C De Santi, VT Orlandi, ...‏
Electronics 10 (14), 1703, 2021‏
472021
GaN-based laser wireless power transfer system‏
C De Santi, M Meneghini, A Caria, E Dogmus, M Zegaoui, F Medjdoub, ...‏
Materials 11 (1), 153, 2018‏
472018
A physical model for the reverse leakage current in (In, Ga) N/GaN light-emitting diodes based on nanowires‏
M Musolino, D Van Treeck, A Tahraoui, L Scarparo, C De Santi, ...‏
Journal of Applied Physics 119 (4), 2016‏
472016
سیستم در حال حاضر قادر به انجام عملکرد نیست. بعداً دوباره امتحان کنید.
مقاله‌ها 1–20