| A compact formulation for avalanche multiplication in SiGe HBTs at high injection levels M Jaoul, C Maneux, D Céli, M Schröter, T Zimmer IEEE Transactions on Electron Devices 66 (1), 264-270, 2018 | 25 | 2018 |
| A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions C Mukherjee, F Marc, M Couret, GG Fischer, M Jaoul, D Céli, K Aufinger, ... Solid-State Electronics 163, 107635, 2020 | 14 | 2020 |
| Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions M Jaoul, D Ney, D Céli, C Maneux, T Zimmer 2019 IEEE 32nd International Conference on Microelectronic Test Structures …, 2019 | 13 | 2019 |
| Avalanche compact model featuring SiGe HBTs characteristics up to BVcbo M Jaoul, D Céli, C Maneux, M Schröter, A Pawlak 2017 47th European Solid-State Device Research Conference (ESSDERC), 70-73, 2017 | 12 | 2017 |
| Scalable compact modeling of trap generation near the EB spacer oxide interface in SiGe HBTs M Couret, M Jaoul, F Marc, C Mukherjee, D Céli, T Zimmer, C Maneux Solid-State Electronics 169, 107819, 2020 | 11 | 2020 |
| Measurement based accurate definition of the SOA edges for SiGe HBTs M Jaoul, D Céli, C Maneux, T Zimmer 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and …, 2019 | 9 | 2019 |
| Study of HBT operation beyond breakdown voltage: Definition of a Safe Operating Area in this operation regime including the aging laws M Jaoul Université de Bordeaux, 2020 | 4 | 2020 |
| Analysis of test structure design induced variation in on Si on-wafer TRL calibration in sub-THz C Yadav, S Fregonese, M Deng, M Cabbia, M De Matos, M Jaoul, ... 2019 IEEE 32nd International Conference on Microelectronic Test Structures …, 2019 | 2 | 2019 |
| Advances in Aging Compact Model for Hot Carrier Degradation in SiGe HBTs under Dynamic Operating conditions for reliability-aware circuit design C Mukherjee, F Marc, M Couret, GG Fischer, M Jaoul, D Celi, K Aufinger, ... European Microwave Week Workshop Recent advances in SiGe BiCMOS …, 2019 | | 2019 |
| Breakdown Voltage, SOA and Aging of HBTs: A Physics Base approach for Compact modeling M Jaoul, C Maneux, T Zimmer, D Céli 31th Bipolar ArbeitsKreis, 2019 | | 2019 |
| Extension of HICUM/L2 Avalanche Model at High Current: Proposal D Céli, M Jaoul, T Zimmer AKB Group Meetings, 2018 | | 2018 |
| Extension of HICUM/L2 Avalanche Model at High Current: Proposal M Jaoul, C Maneux, T Zimmer, D Céli, M Schröter 18th HICUM Workshop, 2018 | | 2018 |
| High Current Impact Ionization Model M Jaoul, C Maneux, T Zimmer, D Céli, M Schröter HICUM WORKSHOP, 2018 | | 2018 |
