An assessment of the generalizability of Internet surveys SJ Best, B Krueger, C Hubbard, A Smith
Social Science Computer Review 19 (2), 131-145, 2001
400 2001 Low dielectric loss and enhanced tunability of MW Cole, WD Nothwang, C Hubbard, E Ngo, M Ervin
Journal of applied physics 93 (11), 9218-9225, 2003
319 2003 Structure–property relationships in pure and acceptor-doped MW Cole, C Hubbard, E Ngo, M Ervin, M Wood, RG Geyer
Journal of applied physics 92 (1), 475-483, 2002
246 2002 Evaluation of commercially available carbon fibers, fabrics, and papers for potential use in multifunctional energy storage applications JF Snyder, EL Wong, CW Hubbard
Journal of the Electrochemical Society 156 (3), A215, 2009
228 2009 Human candidate gene polymorphisms and risk of severe malaria in children in Kilifi, Kenya: a case-control association study CM Ndila, S Uyoga, AW Macharia, G Nyutu, N Peshu, J Ojal, M Shebe, ...
The Lancet Haematology 5 (8), e333-e345, 2018
126 2018 Electrophoretic deposition of pure and MgO-modified E Ngo, PC Joshi, MW Cole, CW Hubbard
Applied Physics Letters 79 (2), 248-250, 2001
107 2001 Happy faces elicit heuristic processing in a televised impression formation task: A cognitive tuning account V Ottati, N Terkildsen, C Hubbard
Personality and Social Psychology Bulletin 23 (11), 1144-1156, 1997
102 1997 Improved Ni based composite Ohmic contact to n -SiC for high temperature and high power device applications MW Cole, PC Joshi, CW Hubbard, MC Wood, MH Ervin, B Geil, F Ren
Journal of Applied Physics 88 (5), 2652-2657, 2000
83 2000 Maximizing “Minimal Effects” The Impact of Early Primary Season Debates on Voter Preferences SJ Best, C Hubbard
American Politics Quarterly 27 (4), 450-467, 1999
66 1999 Enhanced dielectric properties from barium strontium titanate films with strontium titanate buffer layers MW Cole, E Ngo, C Hubbard, SG Hirsch, M Ivill, WL Sarney, J Zhang, ...
Journal of Applied Physics 114 (16), 2013
45 2013 Thermal stability and performance reliability of Pt/Ti/WSi/Ni ohmic contacts to n -SiC for high temperature and pulsed power device applications MW Cole, PC Joshi, C Hubbard, JD Demaree, M Ervin
Journal of applied physics 91 (6), 3864-3868, 2002
33 2002 Ultraviolet assisted processing: A unique approach to mitigate oxygen vacancies and attain low loss highly tunable Ba0. 60Sr0. 40TiO3 thin films MW Cole, RC Toonen, M Ivill, SG Hirsch, E Ngo, C Hubbard
Journal of Applied Physics 110 (12), 2011
24 2011 The role of televised debates in the presidential nominating process SJ Best, C Hubbard, WG Mayer
In pursuit of the White House, 255-284, 2000
24 2000 Processing and Characterization of Pure and Doped Ba0. 6Sr0. 4TiO3 thin films for tunable microwave applications PC Joshi, MW Cole, E Ngo, CW Hubbard
MRS Online Proceedings Library (OPL) 656, DD4. 9, 2000
19 2000 The Reliability of Ni Contacts to n‐SiC Subjected to Pulsed Thermal Fatigue MW Cole, C Hubbard, CG Fountzoulas, D Demaree, A Natarajan, ...
Electrochemical and Solid-state letters 2 (2), 97, 1998
16 1998 SiON low dielectric constant ceramic nanocomposite G Gilde, P Patel, C Hubbard, B Pothier, T Hynes, W Croft, J Wells
US Patent 5,677,252, 1997
16 1997 Dielectric Response of Variable Thickness Ba0. 6Sr0. 4TiO3 Films for Property-Specific Device Applications CV Weiss, MW Cole, SP Alpay, E Ngo, RC Toonen, SG Hirsch, ...
Integrated Ferroelectrics 100 (1), 36-47, 2008
15 2008 Some unusual behavior of dielectric properties of SrTiO3 metal organic chemical vapor deposition grown thin films D Shreiber, MW Cole, E Enriquez, SG Hirsch, E Ngo, C Hubbard, M Ivill, ...
Journal of Applied Physics 116 (9), 2014
13 2014 Ba0. 60Sr0. 40TiO3 Thin Films for Microwave Phase Shifter Devices: The Influence of Crystallization Temperature on the Electric Field Dependent Phase Shift Response MW Cole, RC Toonen, SG Hirsch, E Ngo, RR Romanofsky, F Van Keuls, ...
Integrated Ferroelectrics 111 (1), 68-79, 2010
10 2010 BST films grown by metal organic chemical vapor deposition incorporating real-time control of stoichiometry DA Boyd, SG Hirsch, C Hubbard, MW Cole
Integrated Ferroelectrics 111 (1), 17-26, 2010
8 2010 