Chris M. Fancher

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Jacob L. JonesMaterials Science & Engineering, North Carolina State UniversityDirección de correo verificada de ncsu.edu
Chuanzhen ZhouAnalytical Instrumentation Facility at NC State UniversityDirección de correo verificada de ncsu.edu
Toshikazu NishidaUniversity of FloridaDirección de correo verificada de ufl.edu
Saeed MoghaddamProfessor of Mechanical and Aerospace EngineeringDirección de correo verificada de ufl.edu
John BlendellPurdue UniversityDirección de correo verificada de purdue.edu
Bowman KJUMBCDirección de correo verificada de umbc.edu
Rajeev RanjanDepartment of Materials Engineering Indian Institute of ScienceDirección de correo verificada de iisc.ac.in
Jennifer ForresterNorth Carolina State UniversityDirección de correo verificada de ncsu.edu
Susan Trolier-McKinstrySteward S. Flaschen Professor of Ceramic Science and Engineering and Electrical Eng., Penn StateDirección de correo verificada de psu.edu
Thanakorn IamsasriKing Monkut's University of Technology North BangkokDirección de correo verificada de sci.kmutnb.ac.th
K. V. Lalitha (a.k.a Lalitha Kodumudi...Technische Universität DarmstadtDirección de correo verificada de ceramics.tu-darmstadt.de
Dragan DamjanovicEcole polytechnique fédérale de Lausanne / EPFL - Swiss Federal Institute of Technology in LausanneDirección de correo verificada de epfl.ch
Douglas L IrvingNorth Carolina State UniversityDirección de correo verificada de ncsu.edu
Tedi-Marie Usher-DitzianProcess & Material Development, Cormetech, Inc.Dirección de correo verificada de cormetech.com
Wook JoSchool of Materials Science and Engineering, Ulsan National Institute of Science and TechnologyDirección de correo verificada de unist.ac.kr
James S. Harris, Jr.Professor of Electrical Engineering, Stanford UniversityDirección de correo verificada de stanford.edu

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Chris M. Fancher

Material Science and Technology Division, Oak Ridge National Lab

Dirección de correo verificada de ornl.gov

Texture and Anisotropy Ceramics Materials Characterization


Título Ordenar por citas Ordenar por año Ordenar por título	Citado por Citado por	Año
A comprehensive study on the structural evolution of HfO 2 thin films doped with various dopants MH Park, T Schenk, CM Fancher, ED Grimley, C Zhou, C Richter, ... Journal of Materials Chemistry C 5 (19), 4677-4690, 2017	315	2017
Breaking of macroscopic centric symmetry in paraelectric phases of ferroelectric materials and implications for flexoelectricity A Biancoli, CM Fancher, JL Jones, D Damjanovic Nature materials 14 (2), 224-229, 2015	223	2015
TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films PD Lomenzo, Q Takmeel, C Zhou, CM Fancher, E Lambers, ... Journal of Applied Physics 117 (13), 2015	196	2015
Si doped hafnium oxide—a “fragile” ferroelectric system C Richter, T Schenk, MH Park, FA Tscharntke, ED Grimley, JM LeBeau, ... Advanced Electronic Materials 3 (10), 1700131, 2017	178	2017
Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes PD Lomenzo, P Zhao, Q Takmeel, S Moghaddam, T Nishida, M Nelson, ... Journal of Vacuum Science & Technology B 32 (3), 2014	145	2014
On the Origin of the Large Remanent Polarization in La:HfO₂ T Schenk, CM Fancher, MH Park, C Richter, C Künneth, A Kersch, ... Advanced Electronic Materials 5 (12), 1900303, 2019	111	2019
Ferroelectric Si-Doped HfO₂ Device Properties on Highly Doped Germanium PD Lomenzo, Q Takmeel, CM Fancher, C Zhou, NG Rudawski, ... IEEE Electron Device Letters 36 (8), 766-768, 2015	85	2015
The effects of layering in ferroelectric Si-doped HfO2 thin films PD Lomenzo, Q Takmeel, C Zhou, Y Liu, CM Fancher, JL Jones, ... Applied Physics Letters 105 (7), 2014	64	2014
The contribution of 180 domain wall motion to dielectric properties quantified from in situ X-ray diffraction CM Fancher, S Brewer, CC Chung, S Röhrig, T Rojac, G Esteves, ... Acta materialia 126, 36-43, 2017	57	2017
LIPRAS: Line-profile analysis software G Esteves, K Ramos, CM Fancher, JL Jones Preprint at https://www. researchgate. net/publication/316985889_LIPRAS_Line …, 2017	57	2017
In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films M Wallace, RL Johnson-Wilke, G Esteves, CM Fancher, RHT Wilke, ... Journal of Applied Physics 117 (5), 2015	54	2015
Al-Cu-Ce (-Zr) alloys with an exceptional combination of additive processability and mechanical properties S Bahl, K Sisco, Y Yang, F Theska, S Primig, LF Allard, RA Michi, ... Additive Manufacturing 48, 102404, 2021	53	2021
Effective residual stress prediction validated with neutron diffraction method for metal large-scale additive manufacturing A Nycz, Y Lee, M Noakes, D Ankit, C Masuo, S Simunovic, J Bunn, L Love, ... Materials & Design 205, 109751, 2021	49	2021
Effect of Texture on Temperature‐Dependent Properties of K_0.5Na_0.5NbO₃ Modified Bi_1/2Na_1/2TiO₃–xBaTiO₃ CM Fancher, W Jo, J Rödel, JE Blendell, KJ Bowman Journal of the American Ceramic Society 97 (8), 2557-2563, 2014	46	2014
Accurate nanoscale crystallography in real-space using scanning transmission electron microscopy JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, TE Chan, ... Microscopy and Microanalysis 21 (4), 946-952, 2015	45	2015
Current capabilities of the residual stress diffractometer at the high flux isotope reactor P Cornwell, J Bunn, CM Fancher, EA Payzant, CR Hubbard Review of Scientific Instruments 89 (9), 2018	40	2018
Electric-field-induced structural changes in multilayer piezoelectric actuators during electrical and mechanical loading G Esteves, CM Fancher, S Röhrig, GA Maier, JL Jones, M Deluca Acta materialia 132, 96-105, 2017	40	2017
Use of Bayesian inference in crystallographic structure refinement via full diffraction profile analysis CM Fancher, Z Han, I Levin, K Page, BJ Reich, RC Smith, AG Wilson, ... Scientific reports 6 (1), 31625, 2016	37	2016
Anomalous reduction in domain wall displacement at the morphotropic phase boundary of the piezoelectric alloy system DK Khatua, L KV, CM Fancher, JL Jones, R Ranjan Physical Review B 93 (10), 104103, 2016	37	2016
In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction G Esteves, CM Fancher, JL Jones Journal of Materials Research 30 (3), 340-356, 2015	37	2015

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