Seguir
Frank Scholze
Frank Scholze
Fachbereichsleiter Radiometrie mit Synchrotronstrahlung, Physikalisch-Technische Bundesanstalt
Dirección de correo verificada de ptb.de - Página principal
Título
Citado por
Citado por
Año
Mean energy required to produce an electron-hole pair in silicon for photons of energies between 50 and 1500 eV
F Scholze, H Rabus, G Ulm
Journal of Applied Physics 84 (5), 2926-2939, 1998
1991998
A quarter‐century of metrology using synchrotron radiation by PTB in Berlin
B Beckhoff, A Gottwald, R Klein, M Krumrey, R Müller, M Richter, ...
physica status solidi (b) 246 (7), 1415-1434, 2009
1852009
Modelling the response function of energy dispersive X‐ray spectrometers with silicon detectors
F Scholze, M Procop
X‐Ray Spectrometry: An International Journal 38 (4), 312-321, 2009
1562009
Determination of the electron–hole pair creation energy for semiconductors from the spectral responsivity of photodiodes
F Scholze, H Henneken, P Kuschnerus, H Rabus, M Richter, G Ulm
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2000
1472000
High-accuracy radiometry in the EUV range at the PTB soft x-ray beamline
F Scholze, J Tümmler, G Ulm
Metrologia 40 (1), S224, 2003
1452003
Measurement of detection efficiency and response functions for an Si (Li) x‐ray spectrometer in the range 0.1–5 keV
F Scholze, M Procop
X‐Ray Spectrometry: An International Journal 30 (2), 69-76, 2001
1292001
X-ray ccd calibration for the axaf ccd imaging spectrometer
MW Bautz, MJ Pivovaroff, F Baganoff, T Isobe, SE Jones, SE Kissel, ...
X-Ray Optics, Instruments, and Missions 3444, 210-224, 1998
1281998
Recent developments of wide-bandgap semiconductor based UV sensors
A Benmoussa, A Soltani, U Schühle, K Haenen, YM Chong, WJ Zhang, ...
Diamond and Related Materials 18 (5-8), 860-864, 2009
1182009
High precision soft x‐ray reflectometer
D Fuchs, M Krumrey, P Müller, F Scholze, G Ulm
Review of Scientific Instruments 66 (2), 2248-2250, 1995
1171995
High-accuracy EUV metrology of PTB using synchrotron radiation
F Scholze, B Beckhoff, G Brandt, R Fliegauf, A Gottwald, R Klein, B Meyer, ...
Metrology, inspection, and process control for microlithography XV 4344, 402-413, 2001
1082001
Low energy response of silicon pn-junction detector
R Hartmann, D Hauff, P Lechner, R Richter, L Strüder, J Kemmer, S Krisch, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1996
1041996
Characterization of a windowless Si (Li) detector in the photon energy range 0.1–5 keV
F Scholze, G Ulm
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1994
1001994
Progress in Mo/Si multilayer coating technology for EUVL optics
E Louis, AE Yakshin, PC Goerts, S Oestreich, R Stuik, ELG Maas, ...
Emerging Lithographic Technologies IV 3997, 406-411, 2000
852000
Effect of line roughness on the diffraction intensities in angular resolved scatterometry
A Kato, F Scholze
Applied Optics 49 (31), 6102-6110, 2010
812010
The PTB high-accuracy spectral responsivity scale in the VUV and x-ray range
A Gottwald, U Kroth, M Krumrey, M Richter, F Scholze, G Ulm
Metrologia 43 (2), S125, 2006
792006
Robust UV/VUV/EUV PureB photodiode detector technology with high CMOS compatibility
LK Nanver, L Qi, V Mohammadi, KRM Mok, WB De Boer, N Golshani, ...
IEEE Journal of Selected Topics in Quantum Electronics 20 (6), 306-316, 2014
752014
Plane grating monochromator beamline for VUV radiometry
F Scholze, M Krumrey, P Müller, D Fuchs
Review of scientific instruments 65 (10), 3229-3232, 1994
731994
Characterization of photodiodes as transfer detector standards in the 120 nm to 600 nm spectral range
P Kuschnerus, H Rabus, M Richter, F Scholze, L Werner, G Ulm
Metrologia 35 (4), 355, 1998
711998
NICER instrument detector subsystem: description and performance
G Prigozhin, K Gendreau, JP Doty, R Foster, R Remillard, A Malonis, ...
Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray 9905 …, 2016
692016
Response of niobium-based superconducting tunnel junctions in the soft-x-ray region 0.15–6.5 keV
P Verhoeve, N Rando, J Verveer, A Peacock, A Van Dordrecht, P Videler, ...
Physical Review B 53 (2), 809, 1996
681996
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20