Mechanism of thermal conductivity reduction in few-layer graphene D Singh, JY Murthy, TS Fisher Journal of Applied Physics 110 (4), 044317, 2011 | 213 | 2011 |
Reliability of Raman measurements of thermal conductivity of single-layer graphene due to selective electron-phonon coupling: A first-principles study AK Vallabhaneni, D Singh, H Bao, J Murthy, X Ruan Physical Review B 93 (12), 125432, 2016 | 150 | 2016 |
Self-heat reliability considerations on Intel's 22nm Tri-Gate technology C Prasad, L Jiang, D Singh, M Agostinelli, C Auth, P Bai, T Eiles, J Hicks, ... 2013 IEEE International Reliability Physics Symposium (IRPS), 5D. 1.1-5D. 1.5, 2013 | 125 | 2013 |
Effect of Phonon Dispersion on Thermal Conduction Across Si/Ge Interfaces D Singh, JY Murthy, TS Fisher ASME 2009 InterPACK Conference collocated with the ASME 2009 Summer Heat …, 2009 | 95 | 2009 |
A 7nm CMOS technology platform for mobile and high performance compute application S Narasimha, B Jagannathan, A Ogino, D Jaeger, B Greene, C Sheraw, ... 2017 IEEE International Electron Devices Meeting (IEDM), 29.5. 1-29.5. 4, 2017 | 73 | 2017 |
Spectral phonon conduction and dominant scattering pathways in graphene D Singh, JY Murthy, TS Fisher Journal of Applied Physics 110 (9), 094312, 2011 | 69 | 2011 |
Modeling of Subcontinuum Thermal Transport Across Semiconductor-Gas Interfaces D Singh, X Guo, A Alexeenko, JY Murthy, TS Fisher ASME 2008 Heat Transfer Summer Conference collocated with the Fluids …, 2008 | 66* | 2008 |
A Fast Hybrid Fourier–Boltzmann Transport Equation Solver for Nongray Phonon Transport JM Loy, JY Murthy, D Singh Journal of Heat Transfer 135 (1), 011008, 2013 | 58 | 2013 |
On the accuracy of classical and long wavelength approximations for phonon transport in graphene D Singh, JY Murthy, TS Fisher Journal of Applied Physics 110 (11), 113510, 2011 | 47 | 2011 |
Device reliability metric for end-of-life performance optimization based on circuit level assessment A Kerber, P Srinivasan, S Cimino, P Paliwoda, S Chandrashekhar, ... 2017 IEEE International Reliability Physics Symposium (IRPS), 2D-3.1-2D-3.5, 2017 | 35 | 2017 |
Modeling of subcontinuum thermal transport across semiconductor-gas interfaces D Singh, X Guo, A Alexeenko, JY Murthy, TS Fisher Journal of Applied Physics 106 (2), 024314, 2009 | 24 | 2009 |
Self-heating assessment on bulk FinFET devices through characterization and predictive simulation P Paliwoda, PP Manik, D Singh, Z Chbili, A Kerber, J Johnson, D Misra IEEE Transactions on Device and Materials Reliability 18 (2), 133-138, 2018 | 23 | 2018 |
Phonon transport across mesoscopic constrictions D Singh, JY Murthy, TS Fisher Journal of Heat Transfer 133 (4), 042402, 2011 | 23 | 2011 |
Lattice boltzmann and discrete ordinates methods for phonon transport modeling: A comparative study FN Donmezer, D Singh, W James, A Christensen, S Graham, JY Murthy ASME 2011 International Mechanical Engineering Congress and Exposition, 333-343, 2011 | 18 | 2011 |
Numerical simulation of gas-phonon coupling in thermal transpiration flows X Guo, D Singh, J Murthy, AA Alexeenko Physical Review E 80 (4), 046310, 2009 | 15 | 2009 |
Reconstruction of time-dependent concentration gradients around a KDP crystal growing from its aqueous solution A Srivastava, D Singh, K Muralidhar Journal of Crystal Growth 311 (4), 1166-1177, 2009 | 15 | 2009 |
Frequency and polarization resolved phonon transport in carbon and silicon nanostructures D Singh | 14 | 2011 |
Non-Gray Phonon Transport Using a Hybrid BTE-Fourier Solver JM Loy, D Singh, JY Murthy ASME 2009 Heat Transfer Summer Conference collocated with the InterPACK09 …, 2009 | 13 | 2009 |
Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies D Singh, OD Restrepo, PP Manik, NR Mavilla, H Zhang, P Paliwoda, ... 2018 IEEE International Reliability Physics Symposium (IRPS), 6F. 6-1-6F. 6-7, 2018 | 12 | 2018 |
Ambient temperature and layout impact on self-heating characterization in FinFET devices P Paliwoda, Z Chbili, A Kerber, D Singh, D Misra 2018 IEEE International Reliability Physics Symposium (IRPS), 6E. 2-1-6E. 2-5, 2018 | 12 | 2018 |