| A metamodel family for role-based modeling and programming languages T Kühn, M Leuthäuser, S Götz, C Seidl, U Aßmann Software Language Engineering: 7th International Conference, SLE 2014 …, 2014 | 160 | 2014 |
| DeltaEcore - A model-based delta language generation framework C Seidl, I Schaefer, U Aßmann Modellierung 2014, 2014 | 102 | 2014 |
| System-level test case prioritization using machine learning R Lachmann, S Schulze, M Nieke, C Seidl, I Schaefer 2016 15th IEEE International conference on machine learning and applications …, 2016 | 97 | 2016 |
| Co-evolution of models and feature mapping in software product lines C Seidl, F Heidenreich, U Aßmann Proceedings of the 16th International Software Product Line Conference …, 2012 | 96 | 2012 |
| Integrated management of variability in space and time in software families C Seidl, I Schaefer, U Aßmann Proceedings of the 18th International Software Product Line Conference …, 2014 | 55 | 2014 |
| Capturing variability in space and time with hyper feature models C Seidl, I Schaefer, U Aßmann Proceedings of the 8th International Workshop on Variability Modelling of …, 2014 | 55 | 2014 |
| Context aware reconfiguration in software product lines J Mauro, M Nieke, C Seidl, IC Yu Proceedings of the 10th International Workshop on Variability Modelling of …, 2016 | 51 | 2016 |
| DarwinSPL: An integrated tool suite for modeling evolving context-aware software product lines M Nieke, G Engel, C Seidl Proceedings of the Eleventh International Workshop on Variability Modelling …, 2017 | 42 | 2017 |
| A conceptual model for unifying variability in space and time S Ananieva, S Greiner, T Kühn, J Krüger, L Linsbauer, S Grüner, T Kehrer, ... Proceedings of the 24th ACM Conference on Systems and Software Product Line …, 2020 | 37 | 2020 |
| Anomaly analyses for feature-model evolution M Nieke, J Mauro, C Seidl, T Thüm, IC Yu, F Franzke ACM SIGPLAN Notices 53 (9), 188-201, 2018 | 34 | 2018 |
| Model transformation languages under a magnifying glass: a controlled experiment with Xtend, ATL, and QVT R Hebig, C Seidl, T Berger, JK Pedersen, A Wąsowski Proceedings of the 2018 26th ACM Joint Meeting on European Software …, 2018 | 34 | 2018 |
| Extractive software product line engineering using model-based delta module generation D Wille, T Runge, C Seidl, S Schulze Proceedings of the 11th International Workshop on Variability Modelling of …, 2017 | 34 | 2017 |
| Towards modeling and analyzing variability in evolving software ecosystems C Seidl, U Aßmann Proceedings of the 7th International Workshop on Variability Modelling of …, 2013 | 33 | 2013 |
| Multi-objective black-box test case selection for system testing R Lachmann, M Felderer, M Nieke, S Schulze, C Seidl, I Schaefer Proceedings of the Genetic and Evolutionary Computation Conference, 1311-1318, 2017 | 32 | 2017 |
| Guaranteeing configuration validity in evolving software product lines M Nieke, C Seidl, S Schuster Proceedings of the 10th International Workshop on Variability Modelling of …, 2016 | 32 | 2016 |
| A software product line of feature modeling notations and cross-tree constraint languages C Seidl, T Winkelmann, I Schaefer Modellierung 2016, 157-172, 2016 | 31 | 2016 |
| Aligning coevolving artifacts between software product lines and products S Schulze, M Schulze, U Ryssel, C Seidl Proceedings of the 10th International Workshop on Variability Modelling of …, 2016 | 30 | 2016 |
| Custom-tailored variability mining for block-based languages D Wille, S Schulze, C Seidl, I Schaefer 2016 IEEE 23rd International Conference on Software Analysis, Evolution, and …, 2016 | 28 | 2016 |
| Context-aware reconfiguration in evolving software product lines J Mauro, M Nieke, C Seidl, IC Yu Science of Computer Programming 163, 139-159, 2018 | 27 | 2018 |
| 175% modeling for product-line evolution of domain artifacts S Lity, S Nahrendorf, T Thüm, C Seidl, I Schaefer Proceedings of the 12th International Workshop on Variability Modelling of …, 2018 | 27 | 2018 |
Ina SchaeferKarlsruhe Institute of Technology (KIT)Dirección de correo verificada de kit.edu