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Gia Ngoc Phung
Gia Ngoc Phung
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Crosstalk corrections for coplanar-waveguide scattering-parameter calibrations
DF Williams, FJ Schmückle, R Doerner, GN Phung, U Arz, W Heinrich
IEEE transactions on microwave theory and techniques 62 (8), 1748-1761, 2014
762014
Influence of microwave probes on calibrated on-wafer measurements
GN Phung, FJ Schmückle, R Doerner, B Kähne, T Fritzsch, U Arz, ...
IEEE Transactions on Microwave Theory and Techniques 67 (5), 1892-1900, 2019
472019
Radiation, multimode propagation, and substrate modes in W-band CPW calibrations
FJ Schmückle, R Doerner, GN Phung, W Heinrich, D Williams, U Arz
2011 41st European Microwave Conference, 297-300, 2011
462011
Traceable coplanar waveguide calibrations on fused silica substrates up to 110 GHz
U Arz, K Kuhlmann, T Dziomba, G Hechtfischer, GN Phung, FJ Schmückle, ...
IEEE Transactions on Microwave Theory and Techniques 67 (6), 2423-2432, 2019
332019
Mutual interference in calibration line configurations
FJ Schmückle, T Probst, U Arz, GN Phung, R Doerner, W Heinrich
2017 89th ARFTG Microwave Measurement Conference (ARFTG), 1-4, 2017
242017
Impact of parasitic coupling on multiline TRL calibration
GN Phung, FJ Schmückle, R Doerner, T Fritzsch, W Heinrich
2017 47th European Microwave Conference (EuMC), 835-838, 2017
192017
Effects degrading accuracy of CPW mTRL calibration at W band
GN Phung, FJ Schmückle, R Doerner, W Heinrich, T Probst, U Arz
2018 IEEE/MTT-S International Microwave Symposium-IMS, 1296-1299, 2018
182018
Guidelines for the Design of Calibration Substrates including the Suppression of Parasitic Modes for Frequencies up to and including 325 GHz
M Spirito, U Arz, GN Phung, FJ Schmückle, W Heinrich, R Lozar
EMPIR 14IND02–PlanarCal, 2018, Physikalisch-Technische Bundesanstalt (PTB), 2018
162018
Design, fabrication, and characterization of a D-band bolometric power sensor
M Salek, M Celep, T Weimann, D Stokes, X Shang, GN Phung, ...
IEEE Transactions on Instrumentation and Measurement 71, 1-9, 2022
152022
Impact of substrate modes on mTRL-calibrated CPW measurements in G band
GN Phung, FJ Schmückle, R Doerner, W Heinrich, T Probst, U Arz
2018 48th European Microwave Conference (EuMC), 194-197, 2018
152018
Improved modeling of radiation effects in coplanar waveguides with finite ground width
GN Phung, U Arz, K Kuhlmann, R Doerner, W Heinrich
2020 50th European Microwave Conference (EuMC), 404-407, 2021
132021
Parasitic effects and measurement uncertainties in multi-layer thin-film structures
GN Phung, FJ Schmückle, W Heinrich
2013 European Microwave Conference, 318-321, 2013
112013
Some recent advances in measurements at millimeter-wave and terahertz frequencies: Advances in high frequency measurements
X Shang, N Ridler, D Stokes, J Skinner, F Mubarak, U Arz, GN Phung, ...
IEEE Microwave Magazine 25 (1), 58-71, 2023
102023
Parasitic probe effects in measurements of coplanar waveguides with narrow ground width
GN Phung, U Arz
2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), 1-4, 2020
102020
Anomalies in multiline-TRL-corrected measurements of short CPW lines
GN Phung, U Arz
2021 96th ARFTG Microwave Measurement Conference (ARFTG), 1-4, 2021
82021
Calibration substrate design for accurate mm-wave probe-tip calibration
A Rumiantsev, R Doerner, GN Phung
2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 1-4, 2020
82020
Best practice guide for planar S-parameter measurements using vector network analysers
U Arz, T Probst, K Kuhlmann, N Ridler, X Shang, F Mubarak, J Hoffmann, ...
Physikalisch-Technische Bundesanstalt (PTB), 2019
82019
Interlaboratory investigation of on-wafer s-parameter measurements from 110 GHz to 1.1 THz
X Shang, N Ridler, U Arz, GN Phung, I Roch-Jeune, G Ducournau, ...
2023 53rd European Microwave Conference (EuMC), 624-627, 2023
62023
On the influence of thru-and line-length-related effects in CPW-based multiline TRL calibrations
GN Phung, U Arz
2021 97th ARFTG Microwave Measurement Conference (ARFTG), 1-4, 2021
62021
Impact of chuck boundary conditions on wideband on-wafer measurements
GN Phung, U Arz
2021 IEEE 25th Workshop on Signal and Power Integrity (SPI), 1-4, 2021
52021
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