| X-ray interactions: photoabsorption, scattering, transmission, and reflection at E= 50-30,000 eV, Z= 1-92 BL Henke, EM Gullikson, JC Davis Atomic data and nuclear data tables 54 (2), 181-342, 1993 | 7714 | 1993 |
| Single-cycle nonlinear optics E Goulielmakis, M Schultze, M Hofstetter, VS Yakovlev, J Gagnon, ... Science 320 (5883), 1614-1617, 2008 | 2008 | 2008 |
| Coherent soft x-ray generation in the water window with quasi-phase matching EA Gibson, A Paul, N Wagner, R Tobey, D Gaudiosi, S Backus, ... Science 302 (5642), 95-98, 2003 | 481 | 2003 |
| Initial Calibration of the Atmospheric Imaging Assembly (AIA) on the Solar Dynamics Observatory (SDO) P Boerner, C Edwards, J Lemen, A Rausch, C Schrijver, R Shine, L Shing, ... The Solar Dynamics Observatory, 41-66, 2012 | 480 | 2012 |
| Solid neon moderator for producing slow positrons AP Mills Jr, EM Gullikson Applied Physics Letters 49 (17), 1121-1123, 1986 | 382 | 1986 |
| Attosecond metrology BL Henke, EM Gullikson, JC Davis Atomic Data and Nuclear Data Tales 54, 181-342, 1993 | 238 | 1993 |
| Nonspecular x-ray scattering in a multilayer-coated imaging system DG Stearns, DP Gaines, DW Sweeney, EM Gullikson Journal of Applied Physics 84 (2), 1003-1028, 1998 | 210 | 1998 |
| Stable silicon photodiodes for absolute intensity measurements in the VUV and soft x-ray regions EM Gullikson, R Korde, LR Canfield, RE Vest Journal of Electron Spectroscopy and Related Phenomena 80, 313-316, 1996 | 206 | 1996 |
| Recent developments in EUV reflectometry at the Advanced Light Source EM Gullikson, S Mrowka, BB Kaufmann Emerging Lithographic Technologies V 4343, 363-373, 2001 | 179 | 2001 |
| High-resolution, high-flux, user friendly VLS beamline at the ALS for the 50–1300 eV energy region JH Underwood, EM Gullikson Journal of electron spectroscopy and related phenomena 92 (1-3), 265-272, 1998 | 179 | 1998 |
| Calibration and standards beamline 6.3. 2 at the Advanced Light Source JH Underwood, EM Gullikson, M Koike, PJ Batson, PE Denham, ... Review of Scientific Instruments 67 (9), 3372-3372, 1996 | 178 | 1996 |
| Electronic states in valence and conduction bands of group-III nitrides: Experiment and theory K Lawniczak-Jablonska, T Suski, I Gorczyca, NE Christensen, ... Physical Review B 61 (24), 16623, 2000 | 174 | 2000 |
| Positron dynamics in rare-gas solids EM Gullikson, AP Mills Jr Physical review letters 57 (3), 376, 1986 | 152 | 1986 |
| A soft x-ray/EUV reflectometer based on a laser produced plasma source EM Gullikson, JH Underwood, PC Batson, V Nikitin Journal of X-ray Science and Technology 3 (4), 283-299, 1992 | 142 | 1992 |
| Simultaneous ESR and Magnetization Measurements Characterizing theSpin-Glass State S Schultz, EM Gullikson, DR Fredkin, M Tovar Physical Review Letters 45 (18), 1508, 1980 | 141 | 1980 |
| Molybdenum/beryllium multilayer mirrors for normal incidence in the extreme ultraviolet KM Skulina, CS Alford, RM Bionta, DM Makowiecki, EM Gullikson, ... Applied Optics 34 (19), 3727-3730, 1995 | 139 | 1995 |
| Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet–soft-x-ray region R Soufli, EM Gullikson Applied Optics 36 (22), 5499-5507, 1997 | 123 | 1997 |
| Aqueous solution/metal interfaces investigated in operando by photoelectron spectroscopy O Karslıoğlu, S Nemšák, I Zegkinoglou, A Shavorskiy, M Hartl, F Salmassi, ... Faraday discussions 180, 35-53, 2015 | 119 | 2015 |
| Practical approach for modeling extreme ultraviolet lithography mask defects EM Gullikson, C Cerjan, DG Stearns, PB Mirkarimi, DW Sweeney Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2002 | 118 | 2002 |
| Concentration and chemical-state profiles at heterogeneous interfaces with sub-nm accuracy from standing-wave ambient-pressure photoemission S Nemšák, A Shavorskiy, O Karslioglu, I Zegkinoglou, A Rattanachata, ... Nature Communications 5 (1), 5441, 2014 | 116 | 2014 |
