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Roberto Arce
Roberto Arce
IFIS - Instituto de Física Santa Fe (CONICET - UNL)
Dirección de correo verificada de ifis.santafe-conicet.gov.ar
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Influence of microstructure and hydrogen concentration on amorphous silicon crystallization
N Budini, PA Rinaldi, JA Schmidt, RD Arce, RH Buitrago
Thin Solid Films 518 (18), 5349-5354, 2010
582010
Characterization of fluorine-doped tin oxide produced by the pyrosol method
B Gottlieb, R Koropecki, R Arce, R Crisalle, J Ferron
Thin Solid Films 199 (1), 13-21, 1991
471991
Density of states in the gap of amorphous semiconductors determined from modulated photocurrent measurements in the recombination regime
RR Koropecki, JA Schmidt, R Arce
Journal of applied physics 91 (11), 8965-8969, 2002
422002
Structural analysis of ZnO (: Al, Mg) thin films by X-ray diffraction
FA Garcés, N Budini, RR Koropecki, RD Arce
Procedia Materials Science 8, 551-560, 2015
382015
Infrared study of the kinetics of oxidation in porous amorphous silicon
RR Koropecki, R Arce
Journal of applied physics 60 (5), 1802-1807, 1986
381986
Effect of thickness on structural and electrical properties of Al-doped ZnO films
FA Garcés, N Budini, RD Arce, JA Schmidt
Thin solid films 574, 162-168, 2015
372015
Infrared study of the Si‐H stretching band in a‐SiC:H
RR Koropecki, F Alvarez, R Arce
Journal of applied physics 69 (11), 7805-7811, 1991
341991
Direct evidence of porosity in carbon‐rich hydrogenated amorphous silicon carbide films
R Arce, RR Koropecki, RH Buitrago, F Alvarez, I Chambouleyron
Journal of applied physics 66 (9), 4544-4546, 1989
341989
Structural and magnetic properties of a copper–amino acid salt: Copper (II) bis (α‐amino isobutyrato)
R Calvo, MA Mesa, G Oliva, J Zukerman‐Schpector, OR Nascimento, ...
The Journal of chemical physics 81 (10), 4584-4591, 1984
331984
Semiconductors II: Surfaces, interfaces, microstructures, and related topics-Photo-oxidation effects in porous silicon luminescence
RR Koropecki, RD Arce, JA Schmidt
Physical Review-Section B-Condensed Matter 69 (20), 205317-205317, 2004
322004
Power-law photoconductivity time decay in nanocrystallineTiO2 thin films
D Comedi, SP Heluani, M Villafuerte, RD Arce, RR Koropecki
Journal of Physics: Condensed Matter 19 (48), 486205, 2007
282007
Structural mosaicity and electrical properties of pyrolytic SnO2: F thin films
FA Garcés, N Budini, RR Koropecki, RD Arce
Thin Solid Films 531, 172-178, 2013
272013
Photoinduced phenomena in nanostructured porous silicon
RD Arce, RR Koropecki, G Olmos, AM Gennaro, JA Schmidt
Thin Solid Films 510 (1-2), 169-174, 2006
272006
Analysis of random telegraph noise in large-area amorphous double-barrier structures
T Teuschler, M Hundhausen, L Ley, R Arce
Physical Review B 47 (19), 12687, 1993
271993
Polycrystalline silicon thin film solar cells prepared by PECVD-SPC
RH Buitrago, GA Risso, M Cutrera, M Battioni, L De Bernardez, ...
International Journal of Hydrogen Energy 33 (13), 3522-3525, 2008
252008
Light-induced defects in hydrogenated amorphous silicon studied by the constant-photocurrent method
JA Schmidt, R Arce, RH Buitrago, RR Koropecki
Physical Review B 55 (15), 9621, 1997
251997
Time and field dependence of the magnetization in AuFe, AgMn, and ThGd spin glasses
S Oseroff, M Mesa, M Tovar, R Arce
Journal of Applied Physics 53 (3), 2208-2210, 1982
241982
Light-induced creation of metastable defects in hydrogenated amorphous silicon studied by computer simulations of constant photocurrent measurements
JA Schmidt, RD Arce, RR Koropecki, RH Buitrago
Physical Review B 59 (7), 4568, 1999
221999
Highly doped ZnO films deposited by spray-pyrolysis. Design parameters for optoelectronic applications
FA Garcés, N Budini, JA Schmidt, RD Arce
Thin Solid Films 605, 149-156, 2016
212016
Thickness dependence of crystalline structure of Al-doped ZnO thin films deposited by spray pyrolysis
FA Garcés, N Budini, RD Arce, JA Schmidt
Procedia Materials Science 9, 221-229, 2015
212015
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