Character of the insulating state in NiO: A mixture of charge-transfer and Mott-Hubbard character TM Schuler, DL Ederer, S Itza-Ortiz, GT Woods, TA Callcott, JC Woicik
Physical Review B—Condensed Matter and Materials Physics 71 (11), 115113, 2005
114 2005 Systematic trends of first-principles electronic structure computations of diluted magnetic semiconductors RD McNorton, TM Schuler, JM MacLaren, RA Stern
Physical Review B—Condensed Matter and Materials Physics 78 (7), 075209, 2008
64 2008 Calculated half-metallic behavior in dilute magnetically doped ZnS RA Stern, TM Schuler, JM MacLaren, DL Ederer, V Perez-Dieste, ...
Journal of applied physics 95 (11), 7468-7470, 2004
62 2004 Image-plate sensitivity to x rays at 2 to 60 keV MJ Rosenberg, DB Thorn, N Izumi, D Williams, M Rowland, G Torres, ...
Review of Scientific Instruments 90 (1), 2019
23 2019 New prosthetic devices DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter
US Patent App. 13/966,340, 2014
20 2014 Chemical effects in the manganese x-ray emission that follows resonant and nonresonant photon production of a hole J Jiménez-Mier, DL Ederer, T Schuler
Physical Review B—Condensed Matter and Materials Physics 70 (3), 035216, 2004
15 2004 Electronic structure of the dilute magnetic semiconductor obtained by soft x-ray spectroscopy and first-principles calculations TM Schuler, RA Stern, R McNorton, SD Willoughby, JM MacLaren, ...
Physical Review B—Condensed Matter and Materials Physics 72 (4), 045211, 2005
14 2005 Polyarylene Composition and Articles Made Therefrom DB Thomas, N Maljkovic, T Schuler, TS Rushing, RL Carter
US Patent App. 12/281,023, 2009
10 2009 X-ray Raman scattering at the manganese edge of : Valence emission of J Jiménez-Mier, DL Ederer, T Schuler
Physical Review A—Atomic, Molecular, and Optical Physics 72 (5), 052502, 2005
10 2005 Direct evidence for 3p→ 2pnon-dipole x-ray emission in transition metals J Jiménez-Mier, DL Ederer, T Schuler, TA Callcott
Journal of Physics B: Atomic, Molecular and Optical Physics 36 (11), L173, 2003
8 2003 Ligand field and interference effects in L-edge x-ray Raman scattering of MnF2 and CoF2 J Jiménez-Mier, GM Herrera-Pérez, P Olalde-Velasco, DL Ederer, ...
Revista mexicana de física 54, 30-35, 2008
7 2008 Correlation effects in the resonant and nonresonant manganese photon emission in J Jiménez-Mier, DL Ederer, T Schuler
Physical Review A 68 (4), 042715, 2003
7 2003 Prosthetic devices DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter
US Patent 8,592,531, 2013
5 2013 Electronic structure of transition metal fluorides and oxides determined by resonant X-ray absorption and X-ray emission spectroscopies J Jiménez-Mier, GM Herrera-Pérez, P Olalde-Velasco, E Chavira, ...
Radiation Effects & Defects in Solids 162 (7-8), 613-620, 2007
5 2007 X-ray Raman scattering at the L edge of manganese compounds: Characteristic behaviour of Mn2+ and Mn3+ J Jiménez-Mier, DL Ederer, T Schuler
Radiation Physics and Chemistry 75 (11), 1666-1669, 2006
4 2006 Diffusion of TiN into aluminum films measured by soft X-ray spectroscopy and Rutherford backscattering spectroscopy TM Schuler, DL Ederer, N Ruzycki, G Glass, WA Hollerman, A Moewes, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (5 …, 2001
3 2001 Erratum:“Image-plate sensitivity to x rays at 2 to 60 keV”[Rev. Sci. Instrum. 90, 013506 (2019)] MJ Rosenberg, DB Thorn, N Izumi, D Williams, M Rowland, G Torres, ...
Review of Scientific Instruments 90 (2), 2019
2 2019 Model study of soft x-ray spectroscopy techniques for observing magnetic circular dichroism in buried SmCo magnetic films S Itza-Ortiz, DL Ederer, TM Schuler, N Ruzycki, JS Jiang, SD Bader
Journal of applied physics 93 (4), 2002-2008, 2003
1 2003 NiO: A Charge Transfer or Mott-Hubbard Insulator TM Schuler, DL Ederer, S Itza-Ortiz, GT Woods, TA Callcott, J Woicik
T M. Schuler, D L. Ederer, S Itza-Ortiz, G T. Woods, T A. Callcott, Joseph …, 2021
2021 NEW POLYARYLENE COMPOSITION AND ARTICLES MADE THEREFROM DB Thomas, N Maljkovic, T Schuler, TS Rushing, RL Carter
EP Patent 2,001,955, 2010
2010