| Engineering the thermal conductivity along an individual silicon nanowire by selective helium ion irradiation Y Zhao, D Liu, J Chen, L Zhu, A Belianinov, OS Ovchinnikova, RR Unocic, ... Nature Communications 8 (1), 15919, 2017 | 87 | 2017 |
| Relaxor ferroelectric behavior in barium strontium titanate LM Garten, M Burch, AS Gupta, R Haislmaier, V Gopalan, EC Dickey, ... Journal of the American Ceramic Society 99 (5), 1645-1650, 2016 | 49 | 2016 |
| Data mining for better material synthesis: The case of pulsed laser deposition of complex oxides SR Young, A Maksov, M Ziatdinov, Y Cao, M Burch, J Balachandran, L Li, ... Journal of Applied Physics 123 (11), 2018 | 44 | 2018 |
| Noble gas ion beams in materials science for future applications and devices A Belianinov, MJ Burch, S Kim, S Tan, G Hlawacek, OS Ovchinnikova Mrs Bulletin 42 (9), 660-666, 2017 | 34 | 2017 |
| Direct write of 3D nanoscale mesh objects with platinum precursor via focused helium ion beam induced deposition A Belianinov, MJ Burch, A Ievlev, S Kim, MG Stanford, K Mahady, ... Micromachines 11 (5), 527, 2020 | 26 | 2020 |
| Chemical phenomena of atomic force microscopy scanning AV Ievlev, C Brown, MJ Burch, JC Agar, GA Velarde, LW Martin, ... Analytical chemistry 90 (5), 3475-3481, 2018 | 25 | 2018 |
| Helium ion microscopy for imaging and quantifying porosity at the nanoscale MJ Burch, AV Ievlev, K Mahady, H Hysmith, PD Rack, A Belianinov, ... Analytical chemistry 90 (2), 1370-1375, 2018 | 22 | 2018 |
| A novel work-flow to study Ir electrode thinning and dissolution in proton exchange membrane water electrolyzers MJ Burch, KA Lewinski, MI Buckett, S Luopa, F Sun, EJ Olson, ... Journal of Power Sources 500, 229978, 2021 | 20 | 2021 |
| Mapping 180 polar domains using electron backscatter diffraction and dynamical scattering simulations MJ Burch, CM Fancher, S Patala, M De Graef, EC Dickey Ultramicroscopy 173, 47-51, 2017 | 19 | 2017 |
| Molecular reorganization in bulk bottlebrush polymers: direct observation via nanoscale imaging N Borodinov, A Belianinov, D Chang, JM Carrillo, MJ Burch, Y Xu, K Hong, ... Nanoscale 10 (37), 18001-18009, 2018 | 18 | 2018 |
| Realizing strain enhanced dielectric properties in BaTiO3 films by liquid phase assisted growth DT Harris, MJ Burch, JF Ihlefeld, PG Lam, J Li, EC Dickey, JP Maria Applied Physics Letters 103 (1), 2013 | 14 | 2013 |
| Structures of partially fluorinated bottlebrush polymers in thin films D Chang, M Lorenz, MJ Burch, OS Ovchinnikova, K Hong, BG Sumpter, ... ACS Applied Polymer Materials 2 (2), 209-219, 2019 | 11 | 2019 |
| Building with ions: towards direct write of platinum nanostructures using in situ liquid cell helium ion microscopy AV Ievlev, J Jakowski, MJ Burch, V Iberi, H Hysmith, DC Joy, BG Sumpter, ... Nanoscale 9 (35), 12949-12956, 2017 | 11 | 2017 |
| Ultra-high tunability in polycrystalline Ba1− xSrxTiO3 thin films DT Harris, PG Lam, MJ Burch, J Li, BJ Rogers, EC Dickey, JP Maria Applied Physics Letters 105 (7), 2014 | 10 | 2014 |
| Mechanisms for microstructure enhancement in flux-assisted growth of barium titanate on sapphire MJ Burch, J Li, DT Harris, JP Maria, EC Dickey Journal of Materials Research 29, 843-848, 2014 | 10 | 2014 |
| Low‐Temperature Control of Twins and Abnormal Grain Growth in BaTiO3 DT Harris, MJ Burch, J Li, EC Dickey, JP Maria Journal of the American Ceramic Society 98 (8), 2381-2387, 2015 | 6 | 2015 |
| Microstructure and dielectric properties with CuO additions to liquid phase sintered BaTiO3 thin films DT Harris, MJ Burch, EJ Mily, EC Dickey, JP Maria Journal of Materials Research 31, 1018-1026, 2016 | 5 | 2016 |
| Chemical changes in layered ferroelectric semiconductors induced by helium ion beam A Belianinov, MJ Burch, HE Hysmith, AV Ievlev, V Iberi, MA Susner, ... Scientific Reports 7 (1), 16619, 2017 | 4 | 2017 |
| Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction CM Fancher, MJ Burch, S Patala, EC Dickey Journal of Microscopy 285 (2), 85-94, 2022 | 2 | 2022 |
| Biofilm structure of Geobacter sulfurreducens by helium ion microscopy A Belianinov, MC Halsted, MJ Burch, K Songkil, ST Retterer Microscopy and Microanalysis 23 (S1), 1152-1153, 2017 | 2 | 2017 |
Elizabeth C. DickeyCarnegie Mellon UniversityDirección de correo verificada de cmu.edu