FinFET Modeling for IC Simulation and Design: Using the BSIM-CMG Standard YS Chauhan, DD Lu, V Sriramkumar, S Khandelwal, JP Duarte, ... Academic Press, 2015 | 243 | 2015 |
BSIM6: Analog and RF compact model for bulk MOSFET YS Chauhan, S Venugopalan, MA Chalkiadaki, MAU Karim, H Agarwal, ... IEEE Transactions on Electron Devices 61 (2), 234-244, 2013 | 142 | 2013 |
BSIM—SPICE models enable FinFET and UTB IC designs N Paydavosi, S Venugopalan, YS Chauhan, JP Duarte, S Jandhyala, ... IEEE Access 1, 201-215, 2013 | 142 | 2013 |
BSIM-IMG: A compact model for ultrathin-body SOI MOSFETs with back-gate control S Khandelwal, YS Chauhan, DD Lu, S Venugopalan, MAU Karim, ... IEEE Transactions on Electron Devices 59 (8), 2019-2026, 2012 | 121 | 2012 |
Dielectric properties of dysprosium-and scandium-doped hafnium dioxide thin films C Adelmann, V Sriramkumar, S Van Elshocht, P Lehnen, T Conard, ... Applied Physics Letters 91 (16), 162902, 2007 | 106 | 2007 |
BSIM—Industry standard compact MOSFET models YS Chauhan, S Venugopalan, MA Karim, S Khandelwal, N Paydavosi, ... ESSCIRC (ESSCIRC), 2012 Proceedings of the, 30-33, 2012 | 89 | 2012 |
Extraction of isothermal condition and thermal network in UTBB SOI MOSFETs MA Karim, YS Chauhan, S Venugopalan, AB Sachid, DD Lu, BY Nguyen, ... IEEE Electron Device Letters 33 (9), 1306-1308, 2012 | 53 | 2012 |
Unified FinFET compact model: modelling trapezoidal triple-gate FinFETs JP Duarte, N Paydavosi, S Venugopalan, A Sachid, C Hu 2013 International Conference on Simulation of Semiconductor Processes and …, 2013 | 39 | 2013 |
BSIM compact MOSFET models for SPICE simulation YS Chauhan, S Venugopalan, N Paydavosi, P Kushwaha, S Jandhyala, ... Proceedings of the 20th International Conference Mixed Design of Integrated …, 2013 | 39 | 2013 |
MUSTARD: A coupled, stochastic/deterministic, discrete/continuous technique for predicting the impact of Random Telegraph Noise on SRAMs and DRAMs K Aadithya, S Venogopalan, A Demir, J Roychowdhury Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE, 292-297, 2011 | 36 | 2011 |
SAMURAI: An accurate method for modelling and simulating non-stationary random telegraph noise in SRAMs KV Aadithya, A Demir, S Venugopalan, J Roychowdhury 2011 Design, Automation & Test in Europe, 1-6, 2011 | 35 | 2011 |
BSIM-CG: A compact model of cylindrical/surround gate MOSFET for circuit simulations S Venugopalan, DD Lu, Y Kawakami, PM Lee, AM Niknejad, C Hu Solid-State Electronics 67 (1), 79-89, 2012 | 34 | 2012 |
Accurate prediction of random telegraph noise effects in SRAMs and DRAMs KV Aadithya, A Demir, S Venugopalan, J Roychowdhury IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012 | 32 | 2012 |
A Dynamically Biased Multiband 2G/3G/4G Cellular Transmitter in 28 nm CMOS S Seth, DH Kwon, S Venugopalan, SW Son, Y Zuo, V Bhagavatula, J Lim, ... IEEE Journal of Solid-State Circuits 51 (5), 1096-1108, 2016 | 31 | 2016 |
Recent enhancements in BSIM6 bulk MOSFET model H Agarwal, S Venugopalan, MA Chalkiadaki, N Paydavosi, JP Duarte, ... 2013 International Conference on Simulation of Semiconductor Processes and …, 2013 | 30 | 2013 |
BSIM-CMG 110.0. 0: Multi-gate MOSFET compact model: technical manual S Khandelwal, JP Duarte, AS Medury, S Venugopalan, N Paydavosi, ... BSIM Group UC Berkeley, 2015 | 29 | 2015 |
Phenomenological compact model for QM charge centroid in multigate FETs S Venugopalan, MA Karim, S Salahuddin, AM Niknejad, CC Hu IEEE Transactions on Electron Devices 60 (4), 1480-1484, 2013 | 28 | 2013 |
BSIM6: Symmetric bulk MOSFET model YS Chauhan, MA Karim, S Venugopalan, S Khandelwal, P Thakur, ... Workshop on Compact Modeling, 2012 | 22 | 2012 |
BSIM-CMG 107.0. 0: Multi-Gate MOSFET Compact Model (Technical Manual) V Sriramkumar, N Paydavosi, J Duarte, D Lu, CH Lin, M Dunga, S Yao, ... Dept. of Electrical Engineering and Computer Sciences, Univ. of California …, 2013 | 17 | 2013 |
Global parameter extraction for a multi-gate MOSFETs compact model S Yao, TH Morshed, DD Lu, S Venugopalan, W Xiong, CR Cleavelin, ... 2010 International Conference on Microelectronic Test Structures (ICMTS …, 2010 | 17 | 2010 |