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Co-authors
- A.J. HoutepenFull professor, Delft University of TechnologyVerified email at tudelft.nl
- Laurens SiebbelesDelft University of TechnologyVerified email at tudelft.nl
- Peng BaiPeking universityVerified email at pku.edu.cn
- An HuLeyard Optoelectronic Co., Ltd.Verified email at leyard.com
- Yaolong Liphd, Peking UniversityVerified email at pku.edu.cn
- Yizheng JinZhejiang UnivesityVerified email at zju.edu.cn
- Tom J. SavenijeDepartment of Chemical Engineering, AS, TU DelftVerified email at tudelft.nl
- C. S. Suchand SandeepManipal Institute of Technology, Manipal Academy of Higher EducationVerified email at manipal.edu
- William A. TisdaleProfessor of Chemical Engineering, MITVerified email at mit.edu
- Herre van der ZantKavli Institute of Nanoscience, Delft University of TechnologyVerified email at tudelft.nl
- Mingjian YuanUniversity of TorontoVerified email at utoronto.ca
- Marijn van HuisAssociate ProfessorVerified email at uu.nl
- Lixin Xiao北京大学Verified email at pku.edu.cn
- Yang LiuZhejiang UniversityVerified email at zju.edu.cn
- Jin KuijuanInstitute of Physics, Chinese Academy of SciencesVerified email at iphy.ac.cn
- Yunzhou DengMarie-Curie Fellow at Cavendish Laboratory, University of CambridgeVerified email at cam.ac.uk
- Yu YePeking UniversityVerified email at pku.edu.cn
- Quan SunPeking University Yangtze Delta Institute of OptoelectronicsVerified email at ydioe.pku.edu.cn
- Xinfeng Liu (刘新风)National Center for Nanoscience and Technology; Nanyang Technological UniversityVerified email at nanoctr.cn
- Lucas KunnemanASML, former: TU DelftVerified email at asml.com