| Piston alignment of segmented optical mirrors via convolutional neural networks D Guerra-Ramos, L Díaz-García, J Trujillo-Sevilla, JM Rodríguez-Ramos Optics letters 43 (17), 4264-4267, 2018 | 43 | 2018 |
| The optics of the human eye at 8.6 µm resolution S Bonaque-González, JM Trujillo-Sevilla, M Velasco-Ocaña, ... Scientific Reports 11 (1), 23334, 2021 | 28 | 2021 |
| Wavefront phase measurement of striae in optical glass JM Trujillo-Sevilla, M Velasco-Ocana, S Bonaque-Gonzalez, ... Applied Optics 61 (14), 3912-3918, 2022 | 17 | 2022 |
| Influence of angle Kappa on the optimal intraocular orientation of asymmetric multifocal intraocular lenses S Bonaque-González, MT Jaskulski, D Carmona-Ballester, A Pareja-Ríos, ... Journal of optometry 14 (1), 78-85, 2021 | 17 | 2021 |
| Concepts, laboratory, and telescope test results of the plenoptic camera as a wavefront sensor LF Rodríguez-Ramos, I Montilla, JJ Fernández-Valdivia, JL Trujillo-Sevilla, ... Adaptive Optics Systems III 8447, 1415-1422, 2012 | 16 | 2012 |
| 3D imaging and wavefront sensing with a plenoptic objective JM Rodríguez-Ramos, JP Lüke, R López, JG Marichal-Hernández, ... Three-Dimensional Imaging, Visualization, and Display 2011 8043, 223-233, 2011 | 16 | 2011 |
| Towards piston fine tuning of segmented mirrors through reinforcement learning D Guerra-Ramos, J Trujillo-Sevilla, JM Rodríguez-Ramos applied sciences 10 (9), 3207, 2020 | 14 | 2020 |
| High-resolution wave front phase sensor for silicon wafer metrology JM Trujillo-Sevilla, OC Gonzalez, S Bonaque-González, J Gaudestad, ... Photonic Instrumentation Engineering VI 10925, 108-117, 2019 | 13 | 2019 |
| Atmospherical wavefront phases using the plenoptic sensor (real data) LF Rodríguez-Ramos, I Montilla, JP Lüke, R López, ... Three-Dimensional Imaging, Visualization, and Display 2012 8384, 70-78, 2012 | 11 | 2012 |
| Global piston restoration of segmented mirrors with recurrent neural networks D Guerra-Ramos, J Trujillo-Sevilla, J Manuel Rodríguez-Ramos OSA Continuum 3 (5), 1355-1363, 2020 | 10 | 2020 |
| High resolution imaging and wavefront aberration correction in plenoptic systems JM Trujillo-Sevilla, LF Rodríguez-Ramos, I Montilla, JM Rodríguez-Ramos Optics letters 39 (17), 5030-5033, 2014 | 8 | 2014 |
| New developments at CAFADIS plenoptic camera JM Rodríguez-Ramos, JG Marichal-Hernández, JP Lüke, J Trujillo-Sevilla, ... 2011 10th Euro-American Workshop on Information Optics, 1-3, 2011 | 8 | 2011 |
| Circularly symmetric nanopores in 3D femtosecond laser nanolithography with burst control and the role of energy dose F Paz-Buclatin, M Esquivel-González, A Casasnovas-Melián, ... Nanophotonics 12 (8), 1511-1525, 2023 | 7 | 2023 |
| Wave front phase imaging for silicon wafer metrology JM Trujillo-Sevilla, A Roqué-Velasco, MJ Sicilia, Ó Casanova-González, ... Novel Optical Systems, Methods, and Applications XXV 12216, 18-26, 2022 | 7 | 2022 |
| New metrology technique for measuring wafer geometry on a full 300mm silicon wafer JM Trujillo-Sevilla, Ó Casanova-González, M Velasco-Ocaña, S Ceruso, ... International Conference on Extreme Ultraviolet Lithography 2021 11854, 139-146, 2021 | 7 | 2021 |
| Refractive index estimation in biological tissues by quantitative phase imaging C Cairós, R Oliva-García, G Siverio, JM Trujillo-Sevilla, ... Optical Materials 142, 114087, 2023 | 6 | 2023 |
| New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers JM Trujillo-Sevilla, Á Pérez-García, Ó Casanova-González, ... Photonic Instrumentation Engineering IX 12008, 85-92, 2022 | 6 | 2022 |
| Reconstructing wavefront phase from measurements of its slope, an adaptive neural network based approach S Ceruso, S Bonaque-Gonzalez, A Pareja-Rios, D Carmona-Ballester, ... Optics and Lasers in Engineering 126, 105906, 2020 | 6 | 2020 |
| Method for determining the complex amplitude of the electromagnetic field associated with a scene JMR Ramos, JP Lüke, JMT SEVILLA, JJF VALDIVIA US Patent 10,230,940, 2019 | 6 | 2019 |
| New metrology technique for measuring patterned wafer geometry on a full 300mm wafer JM Trujillo-Sevilla, JM Rodríguez-Ramos, JO Gaudestad, T Osterheld, ... Metrology, Inspection, and Process Control XXXVI 12053, 6-12, 2022 | 5 | 2022 |
