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Florian Schmidt
Florian Schmidt
Robert Bosch GmbH Reutlingen, Deutschland
Verified email at de.bosch.com
Title
Cited by
Cited by
Year
Determination of the mean and the homogeneous barrier height of Cu Schottky contacts on heteroepitaxial β‐Ga2O3 thin films grown by pulsed laser deposition
D Splith, S Müller, F Schmidt, H Von Wenckstern, JJ van Rensburg, ...
physica status solidi (a) 211 (1), 40-47, 2014
1312014
Control of the conductivity of Si‐doped β‐Ga2O3 thin films via growth temperature and pressure
S Müller, H von Wenckstern, D Splith, F Schmidt, M Grundmann
physica status solidi (a) 211 (1), 34-39, 2014
1172014
Schottky contacts to In2O3
H von Wenckstern, D Splith, F Schmidt, M Grundmann, O Bierwagen, ...
APL Materials 2 (4), 2014
742014
Continuous composition spread using pulsed-laser deposition with a single segmented target
H von Wenckstern, Z Zhang, F Schmidt, J Lenzner, H Hochmuth, ...
CrystEngComm 15 (46), 10020-10027, 2013
732013
Comparison of Schottky contacts on β-gallium oxide thin films and bulk crystals
S Müller, H von Wenckstern, F Schmidt, D Splith, FL Schein, H Frenzel, ...
Applied Physics Express 8 (12), 121102, 2015
542015
Method of choice for fabrication of high-quality ZnO-based Schottky diodes
S Müller, H von Wenckstern, F Schmidt, D Splith, R Heinhold, M Allen, ...
Journal of Applied Physics 116 (19), 2014
462014
Morphological, structural and electrical investigations on non-polar a-plane ZnO epilayers
S Lautenschlaeger, S Eisermann, MN Hofmann, U Roemer, M Pinnisch, ...
Journal of crystal growth 312 (14), 2078-2082, 2010
392010
pn‐Heterojunction Diodes with n‐Type In2O3
H von Wenckstern, D Splith, S Lanzinger, F Schmidt, S Müller, P Schlupp, ...
Advanced Electronic Materials 1 (4), 1400026, 2015
372015
Method of choice for the fabrication of high-quality β-gallium oxide-based Schottky diodes
S Müller, H von Wenckstern, F Schmidt, D Splith, H Frenzel, ...
Semiconductor Science and Technology 32 (6), 065013, 2017
202017
Eclipse Pulsed Laser Deposition for Damage‐Free Preparation of Transparent ZnO Electrodes on Top of Organic Solar Cells
S Schubert, F Schmidt, H von Wenckstern, M Grundmann, K Leo, ...
Advanced Functional Materials 25 (27), 4321-4327, 2015
202015
Optical and defect properties of hydrothermal ZnO with low lithium contamination
R Heinhold, HS Kim, F Schmidt, H Von Wenckstern, M Grundmann, ...
Applied Physics Letters 101 (6), 2012
202012
Comparative study of deep defects in ZnO microwires, thin films and bulk single crystals
F Schmidt, S Müller, H Von Wenckstern, CP Dietrich, R Heinhold, HS Kim, ...
Applied Physics Letters 103 (6), 2013
152013
Low rate deep level transient spectroscopy-a powerful tool for defect characterization in wide bandgap semiconductors
F Schmidt, H von Wenckstern, O Breitenstein, R Pickenhain, ...
Solid-state electronics 92, 40-46, 2014
132014
On the radiation hardness of (Mg, Zn) O thin films grown by pulsed-laser deposition
F Schmidt, H Wenckstern, D Spemann, M Grundmann
Applied Physics Letters 101 (1), 2012
122012
Defects in a nitrogen‐implanted ZnO thin film
M Schmidt, M Ellguth, F Schmidt, T Lüder, H Wenckstern, R Pickenhain, ...
physica status solidi (b) 247 (5), 1220-1226, 2010
82010
Electronic defects in In2O3 and In2O3:Mg thin films on r‐plane sapphire
F Schmidt, D Splith, S Müller, H von Wenckstern, M Grundmann
physica status solidi (b) 252 (10), 2304-2308, 2015
72015
Nickel‐related defects in ZnO–A deep‐level transient spectroscopy and photo‐capacitance study
M Schmidt, K Brachwitz, F Schmidt, M Ellguth, H von Wenckstern, ...
physica status solidi (b) 248 (8), 1949-1955, 2011
72011
A continuous composition spread approach towards monolithic, wavelength-selective multichannel UV-photo-detector arrays
H von Wenckstern, Z Zhang, J Lenzner, F Schmidt, M Grundmann
MRS Online Proceedings Library (OPL) 1633, 123-129, 2014
62014
Aluminium‐and gallium‐doped homoepitaxial ZnO thin films: Strain‐engineering and electrical performance
M Lorenz, T Weiss, F Schmidt, H von Wenckstern, M Grundmann
physica status solidi (a) 212 (7), 1440-1447, 2015
42015
Impact of strain on electronic defects in (Mg, Zn) O thin films
F Schmidt, S Müller, H von Wenckstern, G Benndorf, R Pickenhain, ...
Journal of Applied Physics 116 (10), 2014
32014
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