| Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution YS Chu, JM Yi, F De Carlo, Q Shen, WK Lee, HJ Wu, CL Wang, JY Wang, ... Applied Physics Letters 92 (10), 2008 | 264 | 2008 |
| Nondestructive nanoscale 3D elemental mapping and analysis of a solid oxide fuel cell anode KN Grew, YS Chu, J Yi, AA Peracchio, JR Izzo, Y Hwu, F De Carlo, ... Journal of the Electrochemical Society 157 (6), B783, 2010 | 177 | 2010 |
| Morphological and topological analysis of coarsened nanoporous gold by x-ray nanotomography YK Chen, YS Chu, JM Yi, I McNulty, Q Shen, PW Voorhees, DC Dunand Applied Physics Letters 96 (4), 2010 | 127 | 2010 |
| Full-field hard x-ray microscopy below 30 nm: a challenging nanofabrication achievement YT Chen, TN Lo, YS Chu, J Yi, CJ Liu, JY Wang, CL Wang, CW Chiu, ... Nanotechnology 19 (39), 395302, 2008 | 125 | 2008 |
| Three-dimensional mapping of nickel oxidation states using full field x-ray absorption near edge structure nanotomography GJ Nelson, WM Harris, JR Izzo, KN Grew, WKS Chiu, YS Chu, J Yi, ... Applied Physics Letters 98 (17), 2011 | 84 | 2011 |
| Hard x-ray Zernike microscopy reaches 30 nm resolution YT Chen, TY Chen, J Yi, YS Chu, WK Lee, CL Wang, IM Kempson, Y Hwu, ... Optics letters 36 (7), 1269-1271, 2011 | 61 | 2011 |
| Coherent microradiology directly observes a critical cathode-anode distance effect in localized electrochemical deposition SK Seol, JM Yi, X Jin, CC Kim, JH Je, WL Tsai, PC Hsu, Y Hwu, CH Chen, ... electrochemical and solid-state letters 7 (9), C95, 2004 | 38 | 2004 |
| Interaction of micropipes with foreign polytype inclusions in SiC MY Gutkin, AG Sheinerman, TS Argunova, JM Yi, MU Kim, JH Je, ... Journal of applied physics 100 (9), 2006 | 34 | 2006 |
| dependence of synchrotron x-ray induced electroless nickel deposition PH Borse, JM Yi, JH Je, WL Tsai, Y Hwu Journal of Applied Physics 95 (3), 1166-1170, 2004 | 28 | 2004 |
| Formation of magnetic Ni nanoparticles in x-ray irradiated electroless solution PH Borse, JM Yi, JH Je, SD Choi, Y Hwu, P Ruterana, G Nouet Nanotechnology 15 (6), S389, 2004 | 22 | 2004 |
| Magnetic resonance imaging system and magnetic resonance imaging method using excited sub-volumes in groups YB Kim, Y Ryu, J Son, J Yi, S Lee US Patent 9,964,618, 2018 | 21* | 2018 |
| High-resolution hard-x-ray microscopy using second-order zone-plate diffraction J Yi, YS Chu, YT Chen, TY Chen, Y Hwu, G Margaritondo Journal of Physics D: Applied Physics 44 (23), 232001, 2011 | 20 | 2011 |
| X-ray imaging apparatus and control method for the same J Yi, D Kang, YH Sung US Patent 9,504,439, 2016 | 19 | 2016 |
| Dynamical growth behavior of copper clusters during electrodeposition PC Hsu, Y Chu, JM Yi, CL Wang, SR Wu, Y Hwu, G Margaritondo Applied Physics Letters 97 (3), 2010 | 17 | 2010 |
| Role of micropipes in the formation of pores at foreign polytype boundaries in SiC crystals MY Gutkin, AG Sheinerman, TS Argunova, JM Yi, JH Je, SS Nagalyuk, ... Physical Review B—Condensed Matter and Materials Physics 76 (6), 064117, 2007 | 17 | 2007 |
| X-ray imaging apparatus, image processing apparatus and image processing method JM Yi, D Kang, YH Sung, J hak Lee, JY Choi, SM Han US Patent 9,907,528, 2018 | 16 | 2018 |
| X-ray imaging apparatus and method of controlling the same D Kang, K Sunghoon, YH Sung, J Yi, J hak Lee, HAN Seokmin US Patent 10,085,706, 2018 | 14 | 2018 |
| Colloid coalescence with focused x rays BM Weon, JT Kim, JH Je, JM Yi, S Wang, WK Lee Physical Review Letters 107 (1), 018301, 2011 | 14 | 2011 |
| X-ray imaging apparatus and method of controlling the same JM Yi, DG Kang, YH Sung, J hak Lee, SM Han US Patent 9,743,901, 2017 | 13 | 2017 |
| Bright-field imaging of lattice distortions using x rays JM Yi, JH Je, YS Chu, Y Zhong, Y Hwu, G Margaritondo Applied physics letters 89 (7), 2006 | 12 | 2006 |
