| Temporal analysis of the entire ethereum blockchain network L Zhao, S Sen Gupta, A Khan, R Luo Proceedings of the Web Conference 2021, 2258-2269, 2021 | 64 | 2021 |
| Prediction of electrical and physical failure analysis success using artificial neural networks L Zhao, SH Goh, YH Chan, BL Yeoh, H Hu, MH Thor, A Tan, J Lam 2018 IEEE international symposium on the physical and failure analysis of …, 2018 | 20 | 2018 |
| A detailed analysis scheme to interpret multiple photon emissions micrograph for improved diagnostic resolution on open defects SH Goh, EC Manlangit, E Susanto, BL Yeoh, H Hao, A Tan, HHW Ma, ... 2017 IEEE 24th International Symposium on the Physical and Failure Analysis …, 2017 | 6 | 2017 |
| Optimization of an artificial neural network system for the prediction of failure analysis success L Zhao, SH Goh, YH Chan, BL Yeoh, H Hu, MH Thor, A Tan, J Lam Microelectronics Reliability 92, 136-142, 2019 | 5 | 2019 |
| Localization of embedded memories using EeLADA MH Thor, SH Goh, L Zhao, BL Yeoh, YT Ngow, H Hao, YH Chan, J Lam International Symposium for Testing and Failure Analysis 81009, 176-182, 2018 | 5 | 2018 |
| Defect isolation methods and systems SH Goh, YH Chan, BL Yeoh, JCK Lam, L Zhao US Patent 9,958,502, 2018 | 5 | 2018 |
| Take a Closer Look at Electrically-Enhanced LADA: Setup SH Goh, BL Yeoh, GF You, YH Chan, Z Lin, J Lam, CM Chua EDFA Technical Articles 18 (3), 10-16, 2016 | 5 | 2016 |
| Fault Localization Using Dynamic Optical-beam Induced Current Variation Mapping MH Thor, SH Goh, BL Yeoh, H Hao, YH Chan, Z Lin 2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019 | 3 | 2019 |
| Concurrent built-in self-testing under the constraint of shared test resources and its test time reduction SH Goh, YH Chan, Z Lin, J Lam Integration 59, 198-205, 2017 | 3 | 2017 |
| Experimental Demonstration of the Effects of Laser Pulse Duration on SEU and LADA in CMOS Devices SH Goh, BL Yeoh, H Hao, YH Chan, Z Lin, GF You, J Lam, LS Koh, ... International Symposium for Testing and Failure Analysis 81368, 547-554, 2016 | 3 | 2016 |
| A demonstration on the effectiveness of wafer-level thermal microscopy as a complementary tool to photon emission microscopy using MBIST Failure debug BL Yeoh, SH Goh, MH Thor, H Hao, A Tan, YH Chan, Z Lin, SP Neo, ... 2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018 | 2 | 2018 |
| Faster Localization of Logic Soft Failures Using a Combination of Scan Diagnosis at Reduced VDD and LADA SH Goh, YT Ngow, BL Yeoh, E Susanto, H Hao, MH Thor, Z Lin, YH Chan, ... 2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018 | 2 | 2018 |
| Optimization of EeLADA for Circuit Logic Defect Localization Using Defect Simulation M Lee, BL Yeoh, SH Goh, GF You, A Tan, H Hao, YH Chan, L Zhao, ... International Symposium for Testing and Failure Analysis 81368, 540-546, 2016 | 2 | 2016 |
| Graph Mining and Machine Learning for Shader Codes Analysis to Accelerate GPU Tuning L Zhao, A Khan, R Luo, CK Yeo International Conference on Complex Networks and Their Applications, 426-439, 2022 | 1 | 2022 |
| ShaderNet: graph-based shader code analysis to accelerate GPU's performance improvement L Zhao, A Khan, R Luo Proceedings of the 5th ACM SIGMOD Joint International Workshop on Graph Data …, 2022 | 1 | 2022 |
| Dynamic optical beam induced current variation mapping: A fault isolation technique MH Thor, SH Goh, BL Yeoh, H Hao, YH Chan, Z Lin Microelectronics Reliability 107, 113603, 2020 | 1 | 2020 |
| Overview of Wafer-level Electrical Failure Analysis Process for Accelerated Yield Engineering SH Goh, YH Chan, BL Yeoh, H Hao, MH Thor, Z Lin, CM Chua, SH Tan, ... | 1 | 2019 |
| Accurate memory bitmapping based on built-in self-test: challenges and solutions L Zhao, YT Ngow, SH Goh, YH Chan, H Hu, F Jeff, CC Tay 2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019 | 1 | 2019 |
| Identifying shader sub-patterns for GPU performance tuning and architecture design L Zhao, CK Yeo, A Khan, R Luo, LP Jin Scientific Reports 14 (1), 24036, 2024 | | 2024 |
| Anomalous Wafer Map Detection and Localization using Unsupervised Learning L Zhao, CK Yeo The 20th International Conference on IC Design and Technology, 2023 | | 2023 |