| Transmission electron microscopy and diffractometry of materials B Fultz, JM Howe Springer Science & Business Media, 2012 | 1805 | 2012 |
| Interfaces in materials: atomic structure, thermodynamics and kinetics of solid-vapor, solid-liquid and solid-solid interfaces JM Howe (No Title), 1997 | 837 | 1997 |
| Bonding, structure, and properties of metal/ceramic interfaces: Part 1 Chemical bonding, chemical reaction, and interfacial structure JM Howe International materials reviews 38 (5), 233-256, 1993 | 352 | 1993 |
| Atomic-level observation of disclination dipoles in mechanically milled, nanocrystalline Fe M Murayama, JM Howe, H Hidaka, S Takaki Science 295 (5564), 2433-2435, 2002 | 330 | 2002 |
| Atomic mechanisms of precipitate plate growth JM Howe, U Dahmen, R Gronsky Philosophical Magazine A 56 (1), 31-61, 1987 | 280 | 1987 |
| Interphase boundary structures of intragranular proeutectoid α plates in a hypoeutectoid Ti Cr alloy T Furuhara, JM Howe, HI Aaronson Acta metallurgica et materialia 39 (11), 2873-2886, 1991 | 210 | 1991 |
| Convergent-beam electron diffraction analysis of the Ω phase in an Al-4.0 Cu-0.5 Mg-0.5 Ag alloy A Garg, JM Howe Acta metallurgica et materialia 39 (8), 1939-1946, 1991 | 172 | 1991 |
| The role of disconnections in phase transformations JM Howe, RC Pond, JP Hirth Progress in Materials Science 54 (6), 792-838, 2009 | 168 | 2009 |
| Atomic mechanisms of precipitate plate growth in the Al Ag system—I. Conventional transmission electron microscopy JM Howe, HI Aaronson, R Gronsky Acta Metallurgica 33 (4), 639-648, 1985 | 162* | 1985 |
| Precipitation of the Ω phase in an Al-4.0 Cu-0.5 Mg alloy A Garg, YC Chang, JM Howe Scripta Metallurgica et Materialia 24 (4), 677-680, 1990 | 142 | 1990 |
| In situ Transmission-Electron-Microscopy Investigation of Melting <?format ?>in Submicron Al-Si Alloy Particles under Electron-Beam Irradiation T Yokota, M Murayama, JM Howe Physical review letters 91 (26), 265504, 2003 | 138 | 2003 |
| Structure and deformation behavior ofT 1 precipitate plates in an Al- 2Li- 1 Cu alloy JM Howe, J Lee, AK Vasudevan Metallurgical Transactions A 19, 2911-2920, 1988 | 137 | 1988 |
| Crystallographic and mechanistic aspects of growth by shear and by diffusional processes HI Aaronson, T Furuhara, JM Rigsbee, WT Reynolds, JM Howe Metallurgical Transactions A 21, 2369-2409, 1990 | 130 | 1990 |
| Transmission electron microscopy investigation of interfaces in a two-phase TiAl alloy GJ Mahon, JM Howe Metallurgical Transactions A 21, 1655-1662, 1990 | 124 | 1990 |
| Composition and stability of Ω phase in an Al-Cu-Mg-Ag alloy YC Chang, JM Howe Metallurgical and Materials Transactions A 24, 1461-1470, 1993 | 102 | 1993 |
| Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices K Aryana, JT Gaskins, J Nag, DA Stewart, Z Bai, S Mukhopadhyay, ... Nature communications 12 (1), 774, 2021 | 95 | 2021 |
| High-resolution electron microscopy of γ-α2 interfaces in titanium aluminide SR Singh, JM Howe Philosophical Magazine A 66 (5), 739-771, 1992 | 91 | 1992 |
| High in-plane thermal conductivity of aluminum nitride thin films MSB Hoque, YR Koh, JL Braun, A Mamun, Z Liu, K Huynh, ME Liao, ... ACS nano 15 (6), 9588-9599, 2021 | 90 | 2021 |
| In-situ electron microscopy: Applications in physics, chemistry and materials science G Dehm, JM Howe, J Zweck John Wiley & Sons, 2012 | 85 | 2012 |
| Bonding, structure, and properties of metal/ceramic interfaces: Part 2 Interface fracture behaviour and property measurement JM Howe International materials reviews 38 (5), 257-271, 1993 | 84 | 1993 |
Vladimir P. OleshkoNational Institute of Standards and TechnologyVerified email at nist.gov
