| A review on the reliability of GaN-based LEDs M Meneghini, LR Trevisanello, G Meneghesso, E Zanoni IEEE Transactions on Device and Materials Reliability 8 (2), 323-331, 2008 | 332 | 2008 |
| Accelerated life test of high brightness light emitting diodes L Trevisanello, M Meneghini, G Mura, M Vanzi, M Pavesi, G Meneghesso, ... IEEE Transactions on Device and Materials Reliability 8 (2), 304-311, 2008 | 212 | 2008 |
| High temperature electro-optical degradation of InGaN/GaN HBLEDs M Meneghini, L Trevisanello, C Sanna, G Mura, M Vanzi, G Meneghesso, ... Microelectronics Reliability 47 (9-11), 1625-1629, 2007 | 111 | 2007 |
| High-temperature degradation of GaN LEDs related to passivation M Meneghini, LR Trevisanello, U Zehnder, T Zahner, U Strauss, ... IEEE transactions on electron devices 53 (12), 2981-2987, 2006 | 100 | 2006 |
| High brightness GaN LEDs degradation during dc and pulsed stress M Meneghini, S Podda, A Morelli, R Pintus, L Trevisanello, ... Microelectronics Reliability 46 (9-11), 1720-1724, 2006 | 72 | 2006 |
| Thermal stability analysis of high brightness LED during high temperature and electrical aging LR Trevisanello, M Meneghini, G Mura, C Sanna, S Buso, G Spiazzi, ... Seventh International Conference on Solid State Lighting 6669, 231-240, 2007 | 63 | 2007 |
| Reversible degradation of ohmic contacts on p-GaN for application in high-brightness LEDs M Meneghini, LR Trevisanello, U Zehnder, G Meneghesso, E Zanoni IEEE transactions on electron devices 54 (12), 3245-3251, 2007 | 62 | 2007 |
| A model for the thermal degradation of metal/(p-GaN) interface in GaN-based light emitting diodes M Meneghini, L Rigutti, LR Trevisanello, A Cavallini, G Meneghesso, ... Journal of Applied Physics 103 (6), 2008 | 51 | 2008 |
| Extensive analysis of the degradation of phosphor-converted LEDs M Meneghini, LR Trevisanello, F De Zuani, N Trivellin, G Meneghesso, ... Ninth International Conference on Solid State Lighting 7422, 82-93, 2009 | 36 | 2009 |
| Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions M Meneghini, L Trevisanello, S Podda, S Buso, G Spiazzi, G Meneghesso, ... Sixth International Conference on Solid State Lighting 6337, 134-141, 2006 | 30 | 2006 |
| Thermally activated degradation and package instabilities of low flux LEDs L Trevisanello, F De Zuani, M Meneghini, N Trivellin, E Zanoni, ... 2009 IEEE international reliability physics symposium, 98-103, 2009 | 25 | 2009 |
| High-temperature failure of GaN LEDs related with passivation M Meneghini, L Trevisanello, G Meneghesso, E Zanoni, F Rossi, ... Superlattices and Microstructures 40 (4-6), 405-411, 2006 | 25 | 2006 |
| Mounting structure for solid state light sources G Hoetzl, HL Lim, T Preuschl, P Sachsenweger, LR Trevisanello, ... US Patent 8,587,021, 2013 | 24 | 2013 |
| Combined optical and electrical analysis of AlGaN-based deep-UV LEDs reliability M Meneghini, N Trivellin, L Trevisanello, A Lunev, J Yang, Y Bilenko, ... 2008 IEEE International Reliability Physics Symposium, 441-445, 2008 | 19 | 2008 |
| Failure mechanisms of gallium nitride LEDs related with passivation M Meneghini, LR Trevisanello, S Levada, G Meneghesso, G Tamiazzo, ... IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest., 4 …, 2005 | 18 | 2005 |
| Lighting module for mounting onto a rail having an electrical contact M Hast, LR Trevisanello, F Zanon US Patent 8,926,134, 2015 | 13 | 2015 |
| Reversible degradation of GaN LEDs related to passivation M Meneghini, LR Trevisanello, R Penzo, M Benedetti, U Zehnder, ... 2007 IEEE International Reliability Physics Symposium Proceedings. 45th …, 2007 | 12 | 2007 |
| Thermal degradation of InGaN/GaN LEDs ohmic contacts M Meneghini, L Trevisanello, U Zehnder, G Meneghesso, E Zanoni physica status solidi c 5 (6), 2250-2253, 2008 | 11 | 2008 |
| Analysis of diffusion involved in degradation of InGaN-based laser diodes K Orita, S Takigawa, M Yuri, T Tanaka, M Meneghini, N Trivellin, ... 2009 IEEE International Reliability Physics Symposium, 736-740, 2009 | 6 | 2009 |
| Analysis of the temperature impact on reliability of GaN-based light emitting diodes LR Trevisanello Università degli studi di Padova, 2008 | 6 | 2008 |
