Articles with public access mandates - Kenneth ButlerLearn more
Available somewhere: 3
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits
H Gonçalves, X Li, M Correia, V Tavares, J Carulli, K Butler
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015
Mandates: Fundação para a Ciência e a Tecnologia, Portugal
Bayesian model fusion: enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling
S Zhang, X Li, RD Blanton, JM da Silva, JM Carulli, KM Butler
2014 International Test Conference, 1-10, 2014
Mandates: Fundação para a Ciência e a Tecnologia, Portugal
Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter
L Xu, Y Zhuang, R Thinakaran, KM Butler, D Chen
2017 IEEE International Test Conference (ITC), 1-10, 2017
Mandates: US National Science Foundation
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